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Real-Time Electron Counting for Continuous TEM Imaging of Sensitive Samples

Published online by Cambridge University Press:  05 August 2019

Ben Miller ,
Anahita Pakzad  and
Stephen Mick
Ben Miller*
Affiliation:
Gatan Inc. Pleasanton, CA, USA
Anahita Pakzad
Affiliation:
Gatan Inc. Pleasanton, CA, USA
Stephen Mick
Affiliation:
Gatan Inc. Pleasanton, CA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1718 - 1719
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Li, X et al. , Nature Methods 10 (2013), p. 584.Google Scholar
[2]Zhu, Y et al. , Nature Materials 16 (2017), p. 532.Google Scholar
[3]Helveg, S et al. , Micron 68 (2015), p. 176.Google Scholar
[4]The nano-diamond sample used in this work was kindly provided by Dr. Shery Chang (ASU)Google Scholar