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Imaging Chiral Materials with Photon-Induced Near-Field Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Tyler Harvey ,
Jan-Wilke Henke ,
Ofer Kfir ,
Armin Feist  and
Claus Ropers
Tyler Harvey*
Affiliation:
Fourth Physical Institute, University of Göttingen, Göttingen, Germany
Jan-Wilke Henke
Affiliation:
Fourth Physical Institute, University of Göttingen, Göttingen, Germany
Ofer Kfir
Affiliation:
Fourth Physical Institute, University of Göttingen, Göttingen, Germany
Armin Feist
Affiliation:
Fourth Physical Institute, University of Göttingen, Göttingen, Germany
Claus Ropers
Affiliation:
Fourth Physical Institute, University of Göttingen, Göttingen, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1720 - 1721
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Asenjo-Garcia, A. and J., F. de Abajo, García, Physical Review Letters 113 (2014) p. 066102.Google Scholar
[2]Harvey, T. et al. , arXiv:1507.01810 (2015).Google Scholar
[3]Guzzinati, G. et al. , Nature Communications 8, (2017) p. 14999.Google Scholar
[4]Barwick, B. et al. , Nature 462 (2009) p. 902.Google Scholar
[5]Feist, A. et al. , Nature 521 (2015) p. 200.Google Scholar
[6]T.R.H acknowledges the support of a postdoctoral fellowship from Alexander von Humboldt Foundation and its sponsor, the German Federal Ministry for Education and Research. This work was also supported by the Deutsche Forschungsgemeinschaft (DFG-SFB 1073/project A05).Google Scholar