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Compressive Sensing on Diverse STEM Scans: Real-time Feedback, Low-dose and Dynamic Range

Published online by Cambridge University Press:  05 August 2019

Xin Li ,
Ondrej Dyck ,
Sergei V. Kalinin  and
Stephen Jesse
Xin Li
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Stephen Jesse
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1688 - 1689
Copyright
Copyright © Microscopy Society of America 2019 

References

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[10]Research was supported by the US Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Materials Sciences and Engineering Division and Office of Science User Facility and was performed at the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory. We gratefully acknowledge the support of NVIDIA Corporation with the donation of the Titan X Pascal GPU used for this research.Google Scholar