Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

Multivariate Statistical Analysis of Series of Diffraction Patterns

Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors

Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials

Radial Distribution Function Imaging by Diffraction Scanning Electron Microscopy

Effect of Medium Range Order on Crystallization Kinetics of CuxZr1-xThin Film Metallic Glasses

Development of Diffraction Scanning Techniques for Beam Sensitive Polymers.

Study of Structure of Li- and Mn-rich Transition Metal Oxides Using 4D-STEM

Solving Challenging Crystallographic Problems with Automated Electron Diffraction Tomography (ADT)

Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction

Crystal Orientation Angular Resolution with Precession Electron Diffraction

Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction

Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector

Development of STEM-Holography

Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution

Low-Frequency Response of Ptychography in the TEM.

Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Mega-electron-volt Femtosecond Electron Micro-diffraction.

Fundamental Symmetry of Barium Titanate Single Crystal Determined Using Energy-Filtered Scanning Convergent Beam Electron Diffraction

Nanoscale Strain and Composition Mapping in Ionic Thin Film Heterostructures for Resistive Switching Devices

STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract