Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-28T07:32:19.065Z Has data issue: false hasContentIssue false
  • English
  • Français

STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector

Published online by Cambridge University Press:  25 July 2016

Knut Müller-Caspary ,
Andreas Oelsner  and
Pavel Potapov
Knut Müller-Caspary
Affiliation:
IFP, Universitat Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
Andreas Oelsner
Affiliation:
Surface Concept GmbH, Am Sägewerk 23a, 55124 Mainz, Germany
Pavel Potapov
Affiliation:
GLOBALFOUNDRIES Dresden Module 1, Wilschdorfer Landstr. 101, 01109 Dresden, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 520 - 521
Copyright
© Microscopy Society of America 2016 

References

[1] Müller, K., et al., Nature Communications 5 (2014) 5653.Google Scholar
[2] Müller-Caspary, K., Oelsner, A. & Potapov, P. Applied Physics Letters 107 (2015) 072110.CrossRefGoogle Scholar
[3] Müller, K., Rosenauer, A., et al., Microscopy and Microanalysis 18 (2012) 995.Google Scholar
[4] Funding: Deutsche Forschungsgemeinschaft (DFG) under contract MU3660/1-1.Google Scholar