Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-25T17:39:36.044Z Has data issue: false hasContentIssue false
  • English
  • Français

Radial Distribution Function Imaging by Diffraction Scanning Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Xiaoke Mu ,
Di Wang ,
Tao Feng  and
Christian Kübel
Xiaoke Mu
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Helmholtz-Institute Ulm for Electrochemical Energy Storage (HIU), Karlsruhe Institute of Technology (KIT), 89081 Ulm, Germany
Di Wang
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany
Tao Feng
Affiliation:
Herbert Gleiter Institute of Nanoscience, Nanjing University of Science and Technology (NJUST), Nanjing, China
Christian Kübel
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Helmholtz-Institute Ulm for Electrochemical Energy Storage (HIU), Karlsruhe Institute of Technology (KIT), 89081 Ulm, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 488 - 489
Copyright
© Microscopy Society of America 2016 

References

[1] Witte, R, Feng, T, Fang, JX, Fischer, A, Ghafari, M, Kruk, R, Brand, R, Wang, D, Hahn, H & Gleiter, H Appl Phys Lett 103 (2013). p. 073106.CrossRefGoogle Scholar
[2] Egami, T & Billinge, S J L in “Underneath the Bragg peaks structural analysis of complex materials”. Elsevier Ltd, Kidlington, Oxford, UK) p. 55.Google Scholar
[3] Cockayne, D J H & Mckenzie, D R Acta Crystallographica Section A 44 (1988). p. 870.Google Scholar
[4] Authors thank financial support from KNMF and Hi-C project.Google Scholar