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Radial Distribution Function Imaging by Diffraction Scanning Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Xiaoke Mu ,
Di Wang ,
Tao Feng  and
Christian Kübel
Xiaoke Mu
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Helmholtz-Institute Ulm for Electrochemical Energy Storage (HIU), Karlsruhe Institute of Technology (KIT), 89081 Ulm, Germany
Di Wang
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany
Tao Feng
Affiliation:
Herbert Gleiter Institute of Nanoscience, Nanjing University of Science and Technology (NJUST), Nanjing, China
Christian Kübel
Affiliation:
Institut für Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany Helmholtz-Institute Ulm for Electrochemical Energy Storage (HIU), Karlsruhe Institute of Technology (KIT), 89081 Ulm, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 488 - 489
Copyright
© Microscopy Society of America 2016 

References

[1] Witte, R, Feng, T, Fang, JX, Fischer, A, Ghafari, M, Kruk, R, Brand, R, Wang, D, Hahn, H & Gleiter, H Appl Phys Lett 103 (2013). p. 073106.CrossRefGoogle Scholar
[2] Egami, T & Billinge, S J L in “Underneath the Bragg peaks structural analysis of complex materials”. Elsevier Ltd, Kidlington, Oxford, UK) p. 55.Google Scholar
[3] Cockayne, D J H & Mckenzie, D R Acta Crystallographica Section A 44 (1988). p. 870.Google Scholar
[4] Authors thank financial support from KNMF and Hi-C project.Google Scholar