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Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction

Published online by Cambridge University Press:  25 July 2016

Christoph Gammer ,
Burak V. Özdöl ,
Karen C. Bustillo ,
J. Ciston  and
Andrew M. Minor
Christoph Gammer
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Austria
Burak V. Özdöl
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Karen C. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Andrew M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Department of Materials Science and Engineering, University of California, Berkeley, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 502 - 503
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Phillips, P., et al, Ultramicroscopy 111 (2011). p. 1483.CrossRefGoogle Scholar
[2] Gammer, C., et al, Ultramicroscopy 155 (2015). p. 1.CrossRefGoogle Scholar
[3] Ozdol, V.B., et al, Applied Physics Letters 106 (2015). p. 253107.CrossRefGoogle Scholar
[4] The authors acknowledge support by the Austrian Science Fund (FWF):[J3397] and the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the U.S. Dept. of Energy under Contract # DE-AC02-05CH11231.Google Scholar