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Three experts in the field of thin-film optics present a detailed and self-contained theoretical study of planar multilayers and how they can be effectively exploited in both traditional and modern applications. Starting with a discussion of the relevant electromagnetic optics, the fundamental optical properties of multilayers are introduced using an electromagnetic approach based on a direct solving of Maxwell's equations by Fourier transforms. This powerful approach is illustrated through the comprehensive description of two of the most important phenomena in multilayers, i.e. giant field enhancement in dielectric stacks and light scattering from thin-film optical filters. The same approach is extended to the description of the operation of planar microcavities and the balance of energy between radiated and trapped light. This book will be valuable to researchers, engineers and graduate students with interests in nanophotonics, optical telecommunications, observational astronomy and gravitational wave detection.
Nanooptics which describes the interaction of light with matter at the nanoscale, is a topic of great fundamental interest to physicists and engineers and allows the direct observation of quantum mechanical phenomena in action. This self-contained and extensively referenced text describes the underlying theory behind nanodevices operating in the quantum regime for use both in advanced courses and as a reference for researchers in physics, chemistry, electrical engineering, and materials science. Presenting an extensive theoretical toolset for design and analysis of nanodevices, the authors demonstrate the art of developing approximate quantum models of real nanodevices. The rudimentary mathematical knowledge required to master the material is carefully introduced, with detailed derivations and frequent worked examples allowing readers to gain a thorough understanding of the material. More advanced applications are gradually introduced alongside analytical approximations and simplifying assumptions often used to make such problems tractable while representative of the observed features.