In this appendix we give the formal definition of the problems that have been used throughout the survey.
CIRCUIT VALUE
Instance: An encoding of a boolean circuit with n gates together with an input assignment.
Solution: The value of the output gate.
LINEAR PROGRAMMING
Instance: An integer m × n matrix A, an integer m-vector b and an integer n-vector c.
Solution: A rational n-vector x such that A x ≤ b.
Measure:cTx.
HIGH DEGREE SUBGRAPH
Instance: A graph G = (V, E).
Solution: An induced subgraph H of G.
Measure: The minimum degree of H.
HIGH EDGE CONNECTED SUBGRAPH
Instance: A graph G = (V, E).
Solution: An induced subgraph H of G.
Measure: The edge connectivity of H.
HIGH LINKAGE SUBGRAPH
Instance: A graph G = (V, E).
Solution: An induced subgraph H of G.
Measure: The linkage of H, defined as the maximum minimum degree of any of the subgraphs.
HIGH VERTEX CONNECTED SUBGRAPH
Instance: A graph G = (V, E).
Solution: An induced subgraph H of G.
Measure: The connectivity of H.
LOCAL MAXIMUM CUT
Instance: A graph G = (V, E) together with a partition of V.
Solution: A partition locally optimum for non-oblivious local search.
MAXIMUM ACYCLIC SUBGRAPH
Instance: A digraph G = (V, E).
Solution: Subset E′ ⊆ E such that G′ = (V, A′) is acyclic.
Measure: |E′|.
MAXIMUM 0–1 KNAPSACK
Instance: An integer b and a finite set I = {1,…,n}, for each i ∈ I an integer size Si and an integer profit pi
Solution: Subset S ⊆ I such that ∑i∈Ssi ≤ b.
Measure: ∑spi.