Book contents
- Frontmatter
- Contents
- List of main symbols
- Note on units
- Introduction
- 1 Semiconductor statistics
- 2 Recombination statistics
- 3 Auger effects and impact ionization (mainly for bands)
- 4 Radiative recombination (mainly for bands)
- 5 Defects
- 6 Multiphonon recombination
- 7 Recombination in low-dimensional semiconductor structures
- Appendix A The delta function (section 3.2)
- Appendix B Useful identities arising from the periodic boundary condition (section 3.4)
- Appendix C Fourier expansions (section 3.4)
- Appendix D The effective mass sum rule and the dynamics of Bloch electrons (section 3.6)
- Appendix E Diagonalization and Jacobian for the threshold energy and impact ionization calculation (section 3.5.7)
- Appendix F The saddle-point method, and the method of stationary phase (section 6.3)
- Appendix G Evaluation of the integral (6.6.12) (section 6.6)
- References
- Index of names
- Index of topics, concepts and materials
Appendix A - The delta function (section 3.2)
Published online by Cambridge University Press: 22 September 2009
- Frontmatter
- Contents
- List of main symbols
- Note on units
- Introduction
- 1 Semiconductor statistics
- 2 Recombination statistics
- 3 Auger effects and impact ionization (mainly for bands)
- 4 Radiative recombination (mainly for bands)
- 5 Defects
- 6 Multiphonon recombination
- 7 Recombination in low-dimensional semiconductor structures
- Appendix A The delta function (section 3.2)
- Appendix B Useful identities arising from the periodic boundary condition (section 3.4)
- Appendix C Fourier expansions (section 3.4)
- Appendix D The effective mass sum rule and the dynamics of Bloch electrons (section 3.6)
- Appendix E Diagonalization and Jacobian for the threshold energy and impact ionization calculation (section 3.5.7)
- Appendix F The saddle-point method, and the method of stationary phase (section 6.3)
- Appendix G Evaluation of the integral (6.6.12) (section 6.6)
- References
- Index of names
- Index of topics, concepts and materials
Summary
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- Recombination in Semiconductors , pp. 511 - 515Publisher: Cambridge University PressPrint publication year: 1992