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  1. Home
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  3. Measurement Techniques for Radio Frequency Nanoelectronics
  • Cited by 8
  • T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder
Publisher:
Cambridge University Press
Online publication date:
September 2017
Print publication year:
2017
Online ISBN:
9781316343098
DOI:
https://doi.org/10.1017/9781316343098
Subjects:
Physics and Astronomy, Condensed Matter Physics, Nanoscience and Mesoscopic Physics, Engineering, Electronic, Optoelectronic Devices, and Nanotechnology, RF and Microwave Engineering
Series:
The Cambridge RF and Microwave Engineering Series
Information

Book description

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenidesGain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopyDiscover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

Reviews

'This book is an invaluable resource for understanding the field of RF nanoelectronics and the challenges and practice of high frequency measurement technology at the nanoscale. It provides a comprehensive overview of how RF measurement techniques and nanotechnology measurement methodology have merged to realize new technologies such as near-field scanning microwave microscopy and RF scanning probe microscopy, as well as looking at practical applications in nanoscale semiconductor devices and circuits, nanomagnetic systems and the life sciences. The book is a very state-of-the-art treatise on the field of microwave technology at the nanoscale, which every student and practitioner in the field of RF nanoelectronics should have.'

Stephen M. Goodnick - Arizona State University

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