Skip to main content Accessibility help
×
Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-10T05:17:29.265Z Has data issue: false hasContentIssue false

5 - Nanowire Electronic Structure

Published online by Cambridge University Press:  05 April 2016

Jean-Pierre Colinge
Affiliation:
Taiwan Semiconductor Manufacturing Company Limited (TSMC)
James C. Greer
Affiliation:
Tyndall National Institute, Ireland
Get access

Summary

Overview

The electronic structure of a semiconductor nanowire can vary substantially with respect to bulk material properties due to orientation, diameter, strain, quantum confinement, and surface effects. Before introducing the electronic structure of nanowires, the crystal structures of common group IV and III-V binary compounds are introduced. Semiconductor nanowires, even for diameters of a few nanometers, can retain the bonding characteristic of their bulk crystalline forms. This permits classification of nanowires by the crystal orientation aligned to the nanowire long, axial, or “growth” axis. To determine electronic structures of materials generally requires a combination of experimental and theoretical approaches in a fruitful collaboration whereby the strengths of several methods are used to complement one another. Elementary analysis of band structures is considered in relation to the observed properties of materials leading to their categorization as insulators, semiconductors, semimetals, and metals. These basic material categories are the fundamental building blocks for nanoelectronic devices. A brief discussion of experimental and theoretical methods for the determination of electronic properties is given to provide background on the state-of-the-art for electronic structure characterization and calculations. The electronic band structures of common bulk semiconductors are presented for reference. Atomic scale models for nanowires oriented along different crystal directions are introduced with the relationship between confinement normal to a nanowire's long axis and electronic structure expressed in terms of band folding. Representative electronic band structures are then introduced for different nanowire systems based on diameter and orientation to highlight the key effects of reduced dimensionality on electronic structure.

Semiconductor crystal structures: group IV and III-V materials

Group IV bonding and the diamond crystal structure

Silicon crystallizes in a cubic crystal structure that has the same symmetry as the diamond form of carbon. This structure is referred to as the diamond cubic crystal structure or sometimes more colloquially as the “diamond lattice.” The local bonding characteristic of the diamond crystal structure is largely retained when nanowires are patterned from crystalline silicon or grown from bottom-up processes such as those described in Chapter 3. In the diamond structure, each atom is tetrahedrally bonded to four nearest neighbor atoms. Many materials can also exist in amorphous form whereby the long-range order of a crystal is lost.

Type
Chapter
Information
Nanowire Transistors
Physics of Devices and Materials in One Dimension
, pp. 107 - 166
Publisher: Cambridge University Press
Print publication year: 2016

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Davies, J. H., The Physics of Low-dimensional Semiconductors: An Introduction, Cambridge: Cambridge University Press, 1998.Google Scholar
Harrison, W. A., Electronic Structure and the Properties of Solids, New York: Dover, 1989.Google Scholar
Martin, R. M., Electronic Structure: Basic Theory and Practical Methods, Cambridge: Cambridge University Press, 2004.CrossRefGoogle Scholar
McWeeny, R., Methods of Molecular Quantum Mechanics, London: Academic Press, 1993.Google Scholar
Shavitt, I. and Bartlett, R. J., Many-Body Methods in Chemistry and Physics, Cambridge: Cambridge University Press, 2009.CrossRefGoogle Scholar
[1] Numerical Data and Functional Relationships in Science and Technology, Group III, vols. 17a and 22a, ed. Hellwege, K.-H. and Madelung, O., Berlin: Springer, 1982.
[2] Paul, W., “Band structure of the intermetallic semiconductors from pressure experiments,” J. Appl. Phys., vol. 32, pp. 2082–2094, 1961.CrossRefGoogle Scholar
[3] Fahy, S. and Greer, J. C., “Alloy corrections to the virtual crystal approximation and explicit band structure calculations for silicon-germanium,” Mat. Sci. in Semicond. Proc., vol. 3, pp. 109–114, 2000.CrossRefGoogle Scholar
[4] Chuang, S. L., Physics of Photonics Devices, Hoboken, NJ: John Wiley and Sons, 2009.Google Scholar
[5] Wolfe, C. M., Stillman, G. E., and Lindley, W. T., “Electron mobility in high purity GaAs,” J. Appl. Phys., vol. 41, pp. 3088–3091, 1970.CrossRefGoogle Scholar
[6] Vurgaftman, I., Meyer, J. R., and Ram-Mohan, L. R, “Band parameters for III-V compound semiconductors and their alloys,” J. Appl. Phys., vol. 89, pp. 5815–5875, 2001.CrossRefGoogle Scholar
[7] Alamo, J. A. del, “Nanometre-scale electronics with III-V compound semiconductors,” Nature, vol. 479, pp. 317–323, 2011.Google ScholarPubMed
[8] Hurley, P. K.et al., “Structural and electrical properties of HfO2/n-InxGa1-xAs structures (x: 0, 0.15, 0.3 and 0.53),” Physics and Technology of High-K Gate Dielectrics, vol. 25, pp. 113–127, 2009.Google Scholar
[9] Gu, J. J. J.et al., “Size-dependent-transport study of In0.53Ga0.47As gate-all-around nanowire MOSFETs: impact of quantum confinement and volume inversion,” IEEE Electr. Dev. Lett., vol. 33, pp. 967–969, 2012.CrossRefGoogle Scholar
[10] Takeda, Y., Sasaki, A., Imamura, Y., and Takagi, T., “Electron mobility and energy gap of In0.53Ga0.47As on InP substrate,” J. Appl. Phys., vol. 47, pp. 5405–5408, 1976.CrossRefGoogle Scholar
[11] Novoselov, K. S., Geim, A. K., Morozov, S. V., et al., “Electric field effect in atomically thin carbon films,” Science, vol. 306, pp. 666–669, 2004.CrossRefGoogle ScholarPubMed
[12] Allen, M. J., Tung, V. C., and Kaner, R. B., “Honeycomb carbon: A review of graphene,” Chem.Rev. vol. 110, pp. 132–145, 2010.Google ScholarPubMed
[13] Long, B., Manning, M., Burke, M., et al., “Non-covalent functionalization of graphene using self-assembly of alkane-amines,” Adv. Funct. Mater., vol. 22, pp. 717–725, 2012.CrossRefGoogle Scholar
[14] Endo, M., Iijima, S., and Dresselhaus, M. S., Carbon Nanotubes, Oxford: Pergamon Press, 1996.Google Scholar
[15] Iijima, S., “Helical microtubules of graphitic carbon,” Nature, vol. 354, pp. 56–58, 1991.CrossRefGoogle Scholar
[16] Greene-Diniz, G., Jones, S. L. T., Fagas, G.et al., “Divacancies in carbon nanotubes and their influence on electron scattering,” J. Phys.: Condens. Matt., vol. 26, pp. 045303-1–045303-8, 2014.Google ScholarPubMed
[17] Svensson, J. and Campbell, E. E. B., “Schottky barriers in carbon nanotube-metal contacts,” J. Appl. Phys., vol. 110, pp. 111101-1–111101-16, 2011.CrossRefGoogle Scholar
[18] Jones, S. L. T., Greene-Diniz, G., Haverty, M. G., Shankar, S., and Greer, J. C., “Effects of structure on the electronic properties of the iron-carbon nanotube interface,” Chem. Phys. Lett., vol. 615, pp. 11–15, 2014.CrossRefGoogle Scholar
[19] Guo, J., Hasan, S., Javey, A., Bosman, G., and Lundstrom, M., “Assessment of high frequency performance of carbon nanotube transistors,” IEEE Trans. Nanotech., vol. 4, pp. 715–721, 2005.CrossRefGoogle Scholar
[20] Ansari, L., Feldman, B., Fagas, G.et al., “First principle-based analysis of single-walled carbon nanotube and silicon nanowire junctionless transistors,” IEEE Trans. Nanotech., vol. 12, pp. 1075–1081, 2013.CrossRefGoogle Scholar
[21] Wang, Q. H., Kalantar-Zadeh, K. K., Kis, A., Coleman, J. N., and Strano, M. S., “Electronics and optoelectronics of two-dimensional transition metal dichalcogenides,” Nature Nanotech., vol. 7, pp. 699–712, 2012.CrossRefGoogle ScholarPubMed
[22] Canivez, Y., “Quick and easy measurement of the band gap in semiconductors,” Eur. J. Phys., vol. 4, pp. 42–44, 1983.CrossRefGoogle Scholar
[23] Workman, J. Jr. and Springsteen, A., Applied Spectroscopy: A Compact Reference for Practitioners, London: Academic Press, 1997.Google Scholar
[24] Tauc, J., Optical Properties of Amorphous Semiconductors, New York: Plenum Publishers, 1974.CrossRefGoogle Scholar
[25] Kubby, J. A. and Boland, J. J., “Scanning tunneling microscopy of semiconductor surfaces,” Surf. Sci. Rep., vol. 26, pp. 61–204, 1996.CrossRefGoogle Scholar
[26] Nilius, N., Wallis, T. M., and Ho, W., “Development of a one-dimensional band structure in artificial gold chains,” Science, vol. 297, pp. 1853–1856, 2002.CrossRefGoogle ScholarPubMed
[27] Lu, X., Grobis, M., Khoo, K. H., Louie, S. G., and Crommie, M. F., Phys. Rev. Lett., vol. 90, pp. 096802-1–096802-4, 2003.
[28] Larsson, J. A., Elliott, S. D., Greer, J. C., Repp, J., Meyer, G., and Allensprach, R., “Orientation of single C60 molecules adsorbed on Cu(111): low temperature scanning tunnelling microscopy and density functional calculations,” Phys. Rev. B, vol. 77, pp. 115434-1–115434-9, 2008.CrossRefGoogle Scholar
[29] Bardeen, J., “Tunnelling from a many-particle point of view,” Phys. Rev. Lett., vol. 6, pp. 57–59, 1961.CrossRefGoogle Scholar
[30] Feenstra, R. M., Stroscio, J. A., and Fein, A. P., “Tunneling spectroscopy of the Si(111) 2x1 surface,” Surface Science, vol. 181, pp. 295–306, 1987.CrossRefGoogle Scholar
[31] Ma, D. D. D., Lee, C. S., Au, F. C. K., Tong, S. Y., and Lee, S. T., “Small-diameter silicon nanowire surfaces,” Science, vol. 299, pp. 1874–1877, 2003.CrossRefGoogle ScholarPubMed
[32] Damascelli, A., Hussain, Z., and Shen, Z.-X., “Angle-resolved photoemission studies of the cuprate superconductors,” Rev. Mod. Phys., vol. 75, pp. 473–539, 2003.CrossRefGoogle Scholar
[33] Born, M. and Oppenheimer, J. R., “Zur Quantentheorie der Molekeln,” Annalen der Physik, vol. 84, pp. 457–484, 1927.Google Scholar
[34] Heisenberg, W., “Über quantentheoretische Umdeutung kinematischer und mechanischer Beziehungen,” Z. für Physik., vol. 33, pp. 879–893, 1925.CrossRefGoogle Scholar
[35] Schrödinger, E., “Quantisierung als Eigenwertproblem,” Ann. der Physik, vol. 79, pp. 361–376, 1926.Google Scholar
[36] Dirac, P. A. M., “On the theory of quantum mechanics,” Proc. Roy. Soc. A, vol. 112, pp. 661–677, 1926.CrossRefGoogle Scholar
[37] Hartree, D. R., “The wave mechanics of an atom with a non-Coulomb central field: part I, theory and methods,” Proc. Camb. Phil. Soc., vol. 24, pp. 89–110, 1928.Google Scholar
[38] Fock, V., “Näherungsmethode zur Lösung des quantenmechanischen Mehrkörperproblems,” Z. Physik, vol. 61, pp. 126–148, 1930.CrossRefGoogle Scholar
[39] Dirac, P. A. M., “Quantum mechanics of many-electron systems,” Proc. Roy. Soc. London A, vol. 123, pp. 714–733, 1929.CrossRefGoogle Scholar
[40] Slater, J. C., “The theory of complex spectra,” Phys. Rev., vol. 34, 1293–1322, 1929.CrossRefGoogle Scholar
[41] Koopmans, T., “Über die Zuordnung von Wellenfunktionen und Eigenwerten zu den einzelnen Elektronen eines Atoms,” Physica, vol. 1, pp. 104–113, 1934.CrossRefGoogle Scholar
[42] Pickup, B. T. and Goscinski, O., “Direct calculation of ionization energies,” Mol. Phys., vol. 26, pp. 1013–1035, 1973.CrossRefGoogle Scholar
[43] Bartlett, R. J. and Stanton, J. F., “Applications of post Hartree–Fock methods: a tutorial,” Rev. Comp. Chem., vol. 5, pp. 65–169, 1993.Google Scholar
[44] Wigner, E., “On the interaction of electrons in metals,” Phys. Rev., vol. 46, pp. 1002–1011, 1934.CrossRefGoogle Scholar
[45] Thomas, L. H., “The calculation of atomic fields,” Proc. Cambridge Phil. Soc., vol. 23, pp. 542–548, 1927.CrossRefGoogle Scholar
[46] Fermi, E.Un Metodo Statistico per la Determinazione di alcune Prioprietà dell'Atomo,” Rend. Accad. Naz. Lince, vol. 6, pp. 602–607, 1927.Google Scholar
[47] Hohenberg, P. and Kohn, W., “Inhomogeneous electron gas,” Phys. Rev., vol. 136, pp. B864–B871, 1964.CrossRefGoogle Scholar
[48] Kohn, W. and Sham, L. J., “Self-consistent equations including exchange and correlation effects,” Phys. Rev., vol. 140, pp. A1133–A1138, 1965.CrossRefGoogle Scholar
[49] Yeriskin, I., McDermott, S., Bartlett, R. J., Fagas, G. and Greer, J. C., “Electronegativity and electron currents in molecular tunnel junctions,” J. Phys. Chem. C, vol. 114, pp. 20564–20568, 2010.CrossRefGoogle Scholar
[50] Beste, A. and Bartlett, R. J., “Independent particle theory with electron correlation,” J. Chem. Phys., vol. 120, pp. 8395–8404, 2004.CrossRefGoogle ScholarPubMed
[51] Bartlett, R. J., McClellan, J., Greer, J. C., and Monaghan, S., “Quantum mechanics at the core of multi-scale simulations,” J. Comp. Aided Mat. Design, vol. 13, pp. 89–109, 2006.Google Scholar
[52] Aryasetiawany, F. and Gunnarsson, O., “The GW method,” Rep. Prog. Phys., vol. 61, pp. 237–312, 1998.Google Scholar
[53] Schilfgaarde, M. van, Kotani, Takao, and Faleev, S., “Quasiparticle self-consistent GW theory,” Phys. Rev. Lett., vol. 96, pp. 226402-1–226402-4, 2006.Google ScholarPubMed
[54] Neaton, J. B., Hybertsen, M. S. and Louie, S. G., “Renormalization of molecular electronic levels at metal-molecule interfaces,” Phys. Rev. Lett., vol. 97, pp. 216405-1–216405-4, 2006.CrossRefGoogle ScholarPubMed
[55] Garcia-Lastra, J. M., Rostgaard, C., Rubio, A., and Thygesen, K. S., “Polarization-induced renormalization of molecular levels at metallic and semiconducting surfaces,” Phys. Rev. B, vol. 80, pp. 245427-1–245427-7, 2009.CrossRefGoogle Scholar
[56] Turton, R. J., “Band Structure of Si: Overview,” in Properties of Crystalline Silicon, Hull, R., London: INSPEC, the Institution of Electrical Engineers, 2004, pp. 381–382.Google Scholar
[57] Stern, F. and Howard, W. E., “Properties of semiconductor inversion layers in the electric quantum limit,” Phys. Rev. B, vol. 163, pp. 816–835, 1967.CrossRefGoogle Scholar
[58] Huang, L., Lu, N., Yan, J.-A., Chou, M. Y., Wang, C.-Z., and Ho, K.-M., “Size and strain-dependent electronic structures in H-passivated Si [112] nanowires,” J. Chem. Phys. C, vol. 112, pp. 15680–15683, 2008.CrossRefGoogle Scholar
[59] Yan, J.-A. and Chou, M.-Y., “Size and orientation dependence in the electronic properties of silicon nanowires,” Phys. Rev. B, vol. 76, pp. 115319-1–115319-6, 2007.CrossRefGoogle Scholar
[60] Zhao, X., Wei, C. M., Yang, L., and Chou, M. Y., “Quantum confinement and electronic properties in silicon nanowires,” Phys. Rev. Lett., vol. 92, pp. 236805-1–236805-4, 2004.CrossRefGoogle ScholarPubMed
[61] Mohammad, S. Noor, “Understanding quantum confinement in nanowires: basics, applications and possible laws,” J. Phys.: Condens. Matt., vol. 26, pp. 423202-1–423202-28, 2014.Google ScholarPubMed
[62] Nolan, M., 'Callaghan, S., Fagas, G. and Greer, J. C., “Silicon nanowire band gap modification,” Nano Lett., vol. 7, pp. 34–38, 2007.CrossRefGoogle ScholarPubMed
[63] Zhuo, K. and Chou, M.-Y., “Surface passivation and orientation dependence in the electronic properties of silicon nanowires,” J. Phys.: Condens. Matt., vol. 25, pp. 145501-1–145501-11, 2013.Google ScholarPubMed
[64] Niquet, Y. M., Lherbier, A., Quang, N. H., Fernández-Serra, M. V., Blasé, X., and Delerue, C., “Electronic structure of semiconductor nanowires,” Phys. Rev. B, vol. 73, pp. 165319-1–165319-13, 2006.CrossRefGoogle Scholar

Save book to Kindle

To save this book to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×