39 results
A Reconstruction Wizard for Electrostatic Reconstruction
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 704-705
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- August 2022
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Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 718-720
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- August 2022
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Fully Automated Data Acquisition and Reporting for Semiconductor Dopant Analysis
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 726-727
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- August 2022
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New Product Announcement – LEAP 6000XR, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3190-3191
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- August 2022
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Deep-Ultra-Violet Atom-Probe Tomography Using Automation to Understand Operational Parameter Space: A Progress Report
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 710
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- August 2022
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Site-Specific Lift-Out on Complicated Nanoscale Structures
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 92-93
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- August 2022
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New Product Announcement – Invizo 6000, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3188-3189
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- August 2022
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Al2O3 Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy
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- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 13 May 2022, pp. 1453-1462
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- October 2022
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Evaporation-Field Differences with Deep-UV Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1262-1264
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- August 2021
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Electrostatic Reconstruction Technology in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2482-2483
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- August 2021
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Directions in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2464-2466
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- August 2021
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Challenges in Atom Probe Tomography Instrumentation and Reconstruction
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2038-2040
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- August 2021
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Matrix Composition and Fine-scale Structure Analysis of NMC Li-ion Battery Using Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2476-2478
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- August 2021
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Study of LEAP® 5000 Deadtime and Precision via Silicon Pre-Sharpened-Microtip™ Standard Specimens
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- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 28 July 2021, pp. 1019-1037
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- August 2022
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A System for Electrostatic Reconstructions
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2622-2623
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- August 2020
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Silicon-standard-based Comparisons of LEAP Accuracy and Precision
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2084-2085
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- August 2020
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Study of Correlative Evaporation and Ion Dissociation in Atom Probe Data
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 2882
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- August 2020
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Unveiling True Three-dimensional Microstructural Evolution in Novel Chalcogenide Nanocomposites as a Route to Infrared Gradient Refractive Index Functionality
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3078-3080
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- August 2020
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Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 524-525
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- August 2020
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Three-Dimensional Microstructural Characterization of Novel Chalcogenide Nanocomposites for Gradient Refractive Index Applications
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2500-2501
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- August 2019
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