Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-26T21:11:20.006Z Has data issue: false hasContentIssue false
  • English
  • Français

Deep-Ultra-Violet Atom-Probe Tomography Using Automation to Understand Operational Parameter Space: A Progress Report

Published online by Cambridge University Press:  22 July 2022

Ty J. Prosa ,
Dan Lenz ,
Joe Bunton ,
Nick Brewer ,
Gard Groth ,
David A. Reinhard  and
David J. Larson
Ty J. Prosa*
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Dan Lenz
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Joe Bunton
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Nick Brewer
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Gard Groth
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
David A. Reinhard
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
David J. Larson
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Expanding the Limits of Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 710
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Miller, M. K. and Forbes, R. G., Atom-Probe Tomography: The Local Electrode Atom Probe, 1st ed. (Springer US, Boston, MA, 2014).10.1007/978-1-4899-7430-3CrossRefGoogle Scholar
Koelling, S. et al. , Ultramicroscopy 111 (2011), p. 540.10.1016/j.ultramic.2011.01.004CrossRefGoogle Scholar
Prosa, T. et al. , Microsc. Microanal. 27 (S1) (2021), p. 1262.10.1017/S1431927621004736CrossRefGoogle Scholar
Prosa, T. J. et al. , Microsc. Microanal. 25 (2019), p. 425.10.1017/S1431927618015258CrossRefGoogle Scholar
Kölling, S. and Vandervorst, W., Ultramicroscopy 109 (2009), p. 486.10.1016/j.ultramic.2008.11.013CrossRefGoogle Scholar