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Study of Correlative Evaporation and Ion Dissociation in Atom Probe Data

Published online by Cambridge University Press:  30 July 2020

Yimeng Chen ,
Brian Geiser ,
Ed Oltman ,
Katherine Rice ,
Robert Ulfig  and
Ty Prosa
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Brian Geiser
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Ed Oltman
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Katherine Rice
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Robert Ulfig
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Ty Prosa
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2882
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Copyright
Copyright © Microscopy Society of America 2020

References

Rolander, U. & Andren, H.-O. On Atom-Probe Analysis of Cubic MX-Type Carbides and Carbonitrides. Journal de Physique 49, 299–304 (1988).Google Scholar
Saxey, D. W. “Correlated Ion Analysis and the Interpretation of Atom Probe Mass Spectra.” Ultramicroscopy 111 (2011): 473–79.10.1016/j.ultramic.2010.11.021CrossRefGoogle ScholarPubMed
Gault, Baptiste, Saxey, David W., Ashton, Michael W., Sinnott, Susan B., Chiaramonti, Ann N., Moody, Michael P., and Schreiber, Daniel K.. “Behavior of Molecules and Molecular Ions near a Field Emitter.” New Journal of Physics 18, no. 3 (2016): 033031.10.1088/1367-2630/18/3/033031CrossRefGoogle Scholar