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Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Published online by Cambridge University Press:  30 July 2020

Hugues Francois-Saint-Cyr ,
Isabelle Martin ,
Paula Peres ,
Christelle Guillermier ,
Ty Prosa ,
Wilfried Blanc  and
David Larson
Hugues Francois-Saint-Cyr
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Paula Peres
Affiliation:
CAMECA S.A., Gennevilliers, Ile-de-France, France
Christelle Guillermier
Affiliation:
ZEISS SMT Inc., Peabody, Massachusetts, United States
Ty Prosa
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Wilfried Blanc
Affiliation:
Université Nice-Sophia Antipolis, Nice, Provence-Alpes-Cote d'Azur, France
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 524 - 525
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Copyright
Copyright © Microscopy Society of America 2020

References

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