10 results
Low Temperature Electron Microscopy of “Charge-Ordered” Phases
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 934-935
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- August 2019
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Atomic-resolution spectroscopy of quantum materials at cryogenic temperatures
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 582-583
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- August 2019
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Probing the Atomic Lattice Response of Quantum Materials Across Phase Transitions
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 80-81
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- August 2018
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Direct Electron Detection for Atomic Resolution in situ EELS
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1844-1845
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- August 2018
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Direct Electron Detection for Atomic-Resolution EELS Mapping at Cryogenic Temperature
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 454-455
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- August 2018
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Aberration-Corrected STEM/EELS at Cryogenic Temperatures
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 428-429
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- July 2017
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Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by Direct Electron Detection
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 366-367
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- July 2017
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Advances in Mapping Periodic Structural Modulations of Atomic Lattices
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 552-553
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- July 2016
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Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1518-1519
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- July 2016
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Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1137-1138
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- August 2015
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