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Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS

Published online by Cambridge University Press:  23 September 2015

David J. Baek ,
Di Lu ,
Yasuyuki Hikita ,
Harold Y. Hwang  and
Lena F. Kourkoutis
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Di Lu
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA.
Yasuyuki Hikita
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo P.ark, CA, USA.
Harold Y. Hwang
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo P.ark, CA, USA.
Lena F. Kourkoutis
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1137 - 1138
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lu, D, et al, MRS Spring (2014), K12.11.Google Scholar
[2] Chang, C. -P, et al, Nat. Commun. 5 (2014). p 1.Google Scholar
[3] Arredondo, M, et al, Adv. Mater. 22 (2010). p 2430.Google Scholar
[4] This work was supported by the Cornell Center for Materials Research with funding from the NSF MRSEC program (DMR-1120296) and the Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, under contract DE-AC02-76SF00515.Google Scholar