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Aberration-Corrected STEM/EELS at Cryogenic Temperatures

Published online by Cambridge University Press:  04 August 2017

Lena F. Kourkoutis ,
Ismail El Baggari ,
Benjamin H. Savitzky ,
David J. Baek ,
Berit H. Goodge ,
Robert Hovden  and
Michael J. Zachman
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA Kavli Institute at Cornell, Cornell University, Ithaca NY 14853, USA
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca NY 14853, USA
Benjamin H. Savitzky
Affiliation:
Department of Physics, Cornell University, Ithaca NY 14853, USA
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Michael J. Zachman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 428 - 429
Copyright
© Microscopy Society of America 2017 

References

[1] Muller, D. A., et al, Science 319 2008). p. 1073.CrossRefGoogle Scholar
[2] Mundy, J., et al, Nat. Commun 5 2014). p. 3464.Google Scholar
[3] Hovden, R., et al, Proc. Natl. Acad. Sci. U.S.A 113 2016). p. 11420.Google Scholar
[4] We acknowledge support from AFOSR (FA 9550-16-1-0305), NSF MRI award (DMR-1429155), and the Packard Foundation. Work made use of CCMR facilities supported by NSF (DMR-1120296).Google Scholar