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Direct Electron Detection for Atomic Resolution in situ EELS

Published online by Cambridge University Press:  01 August 2018

Berit H. Goodge ,
David J. Baek  and
Lena F. Kourkoutis
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1844 - 1845
Copyright
© Microscopy Society of America 2018 

References

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[7] Support by DOD AFOSR (FA 9550-16-1-0305) and NSF (DMR-1539918, DMR-1429155, DMR-1719875). LSMO/STO sample provided by Y. Hikita and H. Y. Hwang (Stanford University), and Sr2RuO4 sample provided by H. Nair, D. G. Schlom (Cornell University).Google Scholar