12 results
Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 851-852
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- August 2015
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Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 849-850
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- August 2015
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Improving Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 2088-2089
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- August 2014
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Elemental and Isotopic Tomography at Single-Atom-Scale in 4000 and 2400 Ma Zircons
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 978-979
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- August 2013
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Improved Mass Resolving Power and Yield in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 994-995
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- August 2013
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New Applications in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1022-1023
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- August 2013
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Understanding Best Practices for Atom Probe Tomography Implant Analysis
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 986-987
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- July 2012
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Atom Probe Tomography for Surface and Near-Surface Applications
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 910-911
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- July 2012
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New Applications in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 926-927
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- July 2012
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Atom Probe Tomography Analysis of Grain Boundaries in CdTe
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 928-929
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- July 2012
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Formation and characterization of ohmic contacts to n–AlGaAs using Pd/AuGe/Ag/Au
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- Journal:
- Journal of Materials Research / Volume 8 / Issue 5 / May 1993
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- 31 January 2011, pp. 1045-1051
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- May 1993
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Diffusion of Ga Vacancies and Si in GaAs
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- MRS Online Proceedings Library Archive / Volume 163 / 1989
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- 25 February 2011, 677
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- 1989
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