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Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography

Published online by Cambridge University Press:  23 September 2015

T.J. Prosa ,
D. Lawrence ,
D. Olson ,
S. Strennen ,
I. Martin ,
D.J. Larson ,
R.L. Martens ,
J. Goodwin ,
A. Portavoce  and
D. Mangelinck
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
D. Lawrence
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
D. Olson
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
S. Strennen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
I. Martin
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
D.J. Larson
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
R.L. Martens
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, USA.
J. Goodwin
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, USA.
A. Portavoce
Affiliation:
Aix-Marseille Universite, IM2NP, F-13397 Marseille Cedex, France.
D. Mangelinck
Affiliation:
Aix-Marseille Universite, IM2NP, F-13397 Marseille Cedex, France.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 849 - 850
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Marquis, E.A., et al., Current Opinion in Solid State and Materials Science 17(2103), p 217.CrossRefGoogle Scholar
[2] Brandon, D.G., Field Ion Microscopy (Eds. J. Hren & S. Ranganathan Plenum (1968). p 64.Google Scholar
[3] Portavoce, A., et al., Defect and Diffusion Forum 289–292 (2009). p 329.Google Scholar
[4] Portavoce, A., et al., Diffusion and Defect Data 264 (2007). p 33.Google Scholar