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Atom Probe Tomography Analysis of Grain Boundaries in CdTe

Published online by Cambridge University Press:  23 November 2012

D.J. Larson ,
D.A. Reinhard ,
T.J. Prosa ,
D. Olson ,
D. Lawrence ,
P.H. Clifton ,
R.M. Ulfig ,
T.F. Kelly  and
V.S. Smentkowski
D.J. Larson
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
D.A. Reinhard
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
T.J. Prosa
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
D. Olson
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
D. Lawrence
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
P.H. Clifton
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
R.M. Ulfig
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
T.F. Kelly
Affiliation:
Applications, Cameca Instruments Inc, Madison, WI
V.S. Smentkowski
Affiliation:
General Electric Global Research Center, Niskayuna, NY
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 928 - 929
Copyright
Copyright © Microscopy Society of America 2012

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