Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-02T23:16:27.875Z Has data issue: false hasContentIssue false
  • English
  • Français

Understanding Best Practices for Atom Probe Tomography Implant Analysis

Published online by Cambridge University Press:  23 November 2012

T.J. Prosa ,
D.J. Larson ,
D. Olson ,
D. Lawrence ,
K. Henry ,
E. Steel  and
I. Anderson
T.J. Prosa
Affiliation:
Cameca Instruments Inc., Madison, WI
D.J. Larson
Affiliation:
Cameca Instruments Inc., Madison, WI
D. Olson
Affiliation:
Cameca Instruments Inc., Madison, WI
D. Lawrence
Affiliation:
Cameca Instruments Inc., Madison, WI
K. Henry
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
E. Steel
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
I. Anderson
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 986 - 987
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)