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Atom Probe Tomography for Surface and Near-Surface Applications

Published online by Cambridge University Press:  23 November 2012

T.F. Kelly ,
D.P. Olson ,
D. Reinhard ,
I. Martin ,
D. Lawrence ,
T.J. Prosa  and
D.J. Larson
T.F. Kelly
Affiliation:
Cameca Instruments, Inc., Madison, WI
D.P. Olson
Affiliation:
Cameca Instruments, Inc., Madison, WI
D. Reinhard
Affiliation:
Cameca Instruments, Inc., Madison, WI
I. Martin
Affiliation:
Cameca Instruments, Inc., Madison, WI
D. Lawrence
Affiliation:
Cameca Instruments, Inc., Madison, WI
T.J. Prosa
Affiliation:
Cameca Instruments, Inc., Madison, WI
D.J. Larson
Affiliation:
Cameca Instruments, Inc., Madison, WI
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 910 - 911
Copyright
Copyright © Microscopy Society of America 2012

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