Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Johnson, Palmer O.
and
Moonan, William J.
1951.
Chapter V: Recent Developments in Statistical Theory.
Review of Educational Research,
Vol. 21,
Issue. 5,
p.
389.
Jain, S. K.
1959.
Fitting the negative binomial distribution to some data on asynaptic behaviour of chromosomes.
Genetica,
Vol. 30,
Issue. 1,
p.
108.
Patil, G. P.
1960.
On the Evaluation of the Negative Binomial Distribution with Examples.
Technometrics,
Vol. 2,
Issue. 4,
p.
501.
Edwards, Carol B.
and
Gurland, John
1961.
A Class of Distributions Applicable to Accidents.
Journal of the American Statistical Association,
Vol. 56,
Issue. 295,
p.
503.
Barkla, D.H.
Roche, A.F.
Jago, J.D
and
Maritz, J.S.
1966.
Possible sex differences in incidence of caries in human deciduous canines and molars.
Archives of Oral Biology,
Vol. 11,
Issue. 2,
p.
201.
Donald, A. D.
1967.
Population studies on the infective stage of some nematode parasites of sheep I. The frequency distribution of strongyloid infective larvae in random samples of pasture.
Parasitology,
Vol. 57,
Issue. 2,
p.
263.
Rogers, A.
1969.
Quadrat Analysis of Urban Dispersion: 1. Theoretical Techniques.
Environment and Planning A: Economy and Space,
Vol. 1,
Issue. 1,
p.
47.
Weber, Donald C.
1972.
An analysis of the California driver record study in the context of a classical accident model.
Accident Analysis & Prevention,
Vol. 4,
Issue. 2,
p.
109.
Ferguson, D.
1972.
Some characteristics of repeated sickness absence.
Occupational and Environmental Medicine,
Vol. 29,
Issue. 4,
p.
420.
Allison, Paul D.
1980.
Estimation and Testing for a Markov Model of Reinforcement.
Sociological Methods & Research,
Vol. 8,
Issue. 4,
p.
434.
Baine, William B.
Luby, James P.
and
Martin, Stanley M.
1980.
Severe illness with influenza B.
The American Journal of Medicine,
Vol. 68,
Issue. 2,
p.
181.
Ferris-Prabhu, A. V.
1989.
Defect and Fault Tolerance in VLSI Systems.
p.
33.
Ferris-Prabhu, A.V.
1992.
On the assumptions contained in semiconductor yield models.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
Vol. 11,
Issue. 8,
p.
966.
Tripathi, Ram C.
2004.
Encyclopedia of Statistical Sciences.
Tripathi, Ram C.
2005.
Encyclopedia of Statistical Sciences.
Organtini, Paolo
and
Russo, Felice
2013.
Forecast of CMOS Imagers Yield Learning by the Gompertz Model.
IEEE Transactions on Semiconductor Manufacturing,
Vol. 26,
Issue. 3,
p.
393.
Tripathi, Ram C.
2014.
Wiley StatsRef: Statistics Reference Online.
Castellares, Fredy
Lemonte, Artur J.
and
Santos, Marcos A. C.
2020.
On the Nielsen distribution.
Brazilian Journal of Probability and Statistics,
Vol. 34,
Issue. 1,
Castellares, Fredy
Lemonte, Artur J.
and
Moreno–Arenas, Germán
2020.
On the two-parameter Bell–Touchard discrete distribution.
Communications in Statistics - Theory and Methods,
Vol. 49,
Issue. 19,
p.
4834.
Batsidis, Apostolos
Jiménez-Gamero, María Dolores
and
Lemonte, Artur J.
2020.
On goodness-of-fit tests for the Bell distribution.
Metrika,
Vol. 83,
Issue. 3,
p.
297.