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Toward a reference material for line profile analysis

Published online by Cambridge University Press:  22 December 2014

Andrea Troian ,
Luca Rebuffi ,
Matteo Leoni  and
Paolo Scardi
Andrea Troian
Affiliation:
Department of Civil, Environmental and Mechanical Engineering, University of Trento, Trento, Italy
Luca Rebuffi
Affiliation:
Department of Civil, Environmental and Mechanical Engineering, University of Trento, Trento, Italy Elettra-Sincrotrone Trieste S.C.p.A., Trieste, Italy
Matteo Leoni
Affiliation:
Department of Civil, Environmental and Mechanical Engineering, University of Trento, Trento, Italy
Paolo Scardi*
Affiliation:
Department of Civil, Environmental and Mechanical Engineering, University of Trento, Trento, Italy
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

A powder obtained by ball milling a commercial FeMo alloy has been identified and investigated as possible reference material for powder diffraction line profile analysis. Ball milling yields micrometer-scale agglomerate particles made of rounded nanocrystalline domains with extensive lattice defects, so as to produce both size and strain contributions to the line profiles. The capability of a modern whole-powder pattern modeling to accurately quantify those aspects and the stability of the powder over a decade are shown and discussed.

Keywords

line profile analysiswhole-powder pattern modelingball millingFeMo
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Supplement S1 , June 2015 , pp. S47 - S51
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Copyright
Copyright © International Centre for Diffraction Data 2014 

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References

Caglioti, G., Paoletti, A., and Ricci, F. P. (1958). “Choice of collimators for a crystal spectrofotometer for neutron diffraction,” Nucl. Instrum. 3(4), 223–228.Google Scholar
D'Incau, M., Leoni, M., and Scardi, P. (2007). “High-energy grinding of FeMo powders,” J. Mater. Res. 22(6), 1744–1753.Google Scholar
Dinnebier, R. E. and Billinge, S. J. L. (2008). Powder Diffraction. Theory and Practice (RSC Publishing, Cambridge, UK).Google Scholar
Guinebretiere, R. (2007). X-ray diffraction by Polycrystalline Materials (Wiley-ISTE, London, UK).CrossRefGoogle Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York), 2nd ed. Google Scholar
Krivoglaz, M. A. and Ryaboshapka, K. P. (1963). “Theory of X-ray scattering by crystals containing dislocations, screw and edge dislocations randomly distributed throughout the crystal,” Fiz. Metallov. Metalloved. 15, 18–31.Google Scholar
Leoni, M., Confente, T., and Scardi, P. (2006). “PM2K: a flexible program implementing whole powder pattern modelling,” Z. Kristallogr. Suppl. 23, 249–254.Google Scholar
Martinez-Garcia, J., Leoni, M., and Scardi, P. (2009). “A general approach for determining the diffraction contrast factor of straight-line dislocations,” Acta Crystallogr. A 65, 109–119.Google Scholar
Mittemeijer, E. J. and Scardi, P. (Eds.) (2004). Diffraction Analysis of the Microstructure of Materials (Springer series in Materials Science, Berlin, Germany).CrossRefGoogle Scholar
Scardi, P. and Leoni, M. (2002). “Whole powder pattern modelling,” Acta Crystallogr. A 58, 190–200.Google Scholar
Scardi, P. and Leoni, M. (2006). “Line profile analysis: pattern modeling versus profile fitting,” J. Appl. Crystallogr. 39, 24–31.Google Scholar
Scardi, P., Ortolani, M., and Leoni, M. (2010). “WPPM: microstructural analysis beyond the Rietveld method,” Mater. Sci. Forum 651, 155–171.CrossRefGoogle Scholar
Schwartz, L. H. and Cohen, J. B. (1977). Diffraction from Materials (Academic Press, New York).Google Scholar
Snyder, R. L., Fiala, J., and Bunge, H. J. (Eds.) (2000). Defect and Microstructure Analysis by Diffraction (International Union of Crystallography; Oxford University Press).CrossRefGoogle Scholar
Staudemann, J. L., et al. (2000). Certicate – Standard Reference Material 660a (NIST, Gaithersburg, MD).Google Scholar
Wilkens, M. (1970a). “Theoretical aspects of kinematical X-ray diffraction profiles from crystals containing dislocation distributions,” In Fundamental Aspects of Dislocation Theory, edited by Simmons, J. A., de Wit, R. and Bullough, R. National Bureau of Standards (US) Special Publication No. 317 (National Bureau of Standards, Washington, DC), Vol. II, pp. 1195–1221.Google Scholar
Wilkens, M. (1970b). “Determination of density and distribution of dislocations in deformed single crystals from broadened x- ray diffraction profiles,” Phys. Status Solidi A, 2, 359–370.CrossRefGoogle Scholar