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Rietveld analysis of high-density polyethylene

Published online by Cambridge University Press:  10 January 2013

Sampath S. Iyengar  and
Simona Percec
Sampath S. Iyengar
Affiliation:
Analytical Materials Laboratory, P.O. Box 1141, Lompoc, California 93438
Simona Percec
Affiliation:
BP Research and Environmental Science Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
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Abstract

Wide angle X-ray powder diffraction data from unoriented and uniaxially oriented films of high-density polyethylene were analyzed by the Rietveld whole pattern profile fitting technique. A Voigt function was used to model the profile and extract crystallographic information such as the unit cell dimensions, crystallite size and strain, and degree of orientation. The analysis revealed that the technique was efficient in providing not only accurate unit cell dimensions without an internal standard, but also crystallite size and strain information. The oriented films were also successfully modeled with this technique.

Keywords

High-density polyethylenecrystallinitycrystallite sizeorientationX-ray diffraction
Type
Research Article
Information
Powder Diffraction , Volume 9 , Issue 3 , September 1994 , pp. 217 - 220
Copyright
Copyright © Cambridge University Press 1994

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References

Barry, D. B., and Brian, Egan J. (1989). “Structure of High Density Polyethylene: a wide angle X-ray Analysis,” Materials Forum 13, 288.Google Scholar
Bish, D. L., and Howard, C. J. (1988). Quantitative phase analysis using the Rieveld Method,” J. Appl. Crystallogr. 21, 86–91.CrossRefGoogle Scholar
Bunn, C. W. (1939). “Structure of Long-Chain Normal Paraffin Hydrocarbons, ‘shape’ of CH2 Group,” Trans. Faraday Soc. 35, 482.CrossRefGoogle Scholar
Caglioti, C., Paoletti, A., and Ricci, F. P. (1958). “Choice of Collimators for a Crystal Spectrometer for Neutron Diffraction,” Nucl. Instrum. 3, 223–228.CrossRefGoogle Scholar
Cullity, B. D. (1978) Elements of X-ray Diffraction (Addison-Wesley, Reading, MA), 2nd ed.Google Scholar
de Keijser, Th. H., Mittemeijer, E. J., and Rozendaal, H. C. F. (1983). “The Determination of Crystallite-size and Lattice Strain Parameter in Conjunction with the Profile Refinement Method for the Determination of Crystal Structure,” J. Appl. Crystallogr. 16, 309.CrossRefGoogle Scholar
Dollase, W. A. (1986). “Correction of Intensities for Preferred Orientation in Powder Diffractometry—Application of the March Model,” J. Appl. Crystallogr. 19, 267.CrossRefGoogle Scholar
Hay, J. N., Kemmish, D. J., Langfor, J. I., and Rae, A. I. M. (1984). “The Structure of Crystalline PEEK,” Polymer Commun. 25, 174.Google Scholar
Hay, J. N., Kemmish, D. J., Langfor, J. I., and Rae, A. I. M. (1985). “The Structure of Crystalline PEEK,” Polymer Commun. 26, 238.Google Scholar
Hill, R. J., and Howard, C. J. (1987). “Quantitative Phase Analysis from Neutron Powder Diffraction Data Using the Rietveld Method,” J. App. Crystallogr. 20, 467.CrossRefGoogle Scholar
Howard, C. J., and Hill, R. J. (1986). Australian Atomic Energy Commission Rep. No. M112.9.Google Scholar
Kavesh, S. and Schultz, J. M. (1970). “Lamellar and Interlamellar Structure in Multi-crystallized Polyethylene. I. Degree of Crystallinity, Atomic Position, Particle Size and Lattice Disorder of the First and Second Kinds,” J. Poly. Sci. Part A-2, 8, 243.Google Scholar
Lightfoot, P., Tremayne, M., Harris, K. D. M., and Bruce, P. G. (1992). “Determination of a Molecular Crystal Structure by X-ray Powder Diffraction on Conventional Laboratory Instrument,” J. Chem. Soc., Chem. Commun. 1012–1013.CrossRefGoogle Scholar
Lutterotti, L., and Scardi, P. (1990). “Simultaneous Structure and Size-strain Refinement by the Rietveld Method,” J. Appl. Crystallogr. 23, 246.CrossRefGoogle Scholar
Madsen, I. C., and Hill, R. J. (1988). “Effect of Divergence and Receiving Slits on Peak Profile Parameters in Rietveld Analysis of X-ray Diffraction Data,” J. Appl. Crystallogr. 21, 398.CrossRefGoogle Scholar
O'Connor, B. H., Li, D. Y., and Sitepu, H. (1991). “Strategies for Preferred Orientation Corrections in X-ray Powder Diffraction Using Line Intensity Ratios,” Adv. X-ray Anal. 34, 409.Google Scholar
Wiles, D. B., and Young, R. A. (1981). “A New Computer Program for Rieveld Analysis of X-ray Powder Diffraction Patterns,” J. Appl. Crystallogr. 14, 149.CrossRefGoogle Scholar
Young, R. A. (1993). “The Rietveld method,” Int. Union of Crystallography, Monogr. 5 (Oxford U.P., Oxford).CrossRefGoogle Scholar