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D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline

Published online by Cambridge University Press:  20 May 2016

M. Holt ,
S. Hruszkewycz ,
R. Winarski ,
V. Rose  and
J. Maser
M. Holt
Affiliation:
Argonne National Laboratory, Argonne, IL
S. Hruszkewycz
Affiliation:
Argonne National Laboratory, Argonne, IL
R. Winarski
Affiliation:
Argonne National Laboratory, Argonne, IL
V. Rose
Affiliation:
Argonne National Laboratory, Argonne, IL
J. Maser
Affiliation:
Argonne National Laboratory, Argonne, IL
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 217
Copyright
Copyright © Cambridge University Press 2010

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