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A new method for Rietveld clay analysis. Part I. Use of a universal measured standard profile for Rietveld quantification of montmorillonites

Published online by Cambridge University Press:  10 January 2013

J. C. Taylor  and
C. E. Matulis
J. C. Taylor
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
C. E. Matulis
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
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Abstract

A new method for the quantification of montmorillonite by full-profile Rietveld analysis of the XRD profile is presented. A measured standard XRD pattern of Algerian bentonite was used to construct a universally applicable montmorillonite (hkl) file for use with a P.C. based Rietveld XRD quantitative analysis system, SIROQUANT. “Universal” means that the standard file can be used for montmorillonites from other localities. The validity of the montmorillonite standard profile was tested with weighed mixtures of quartz and different standard montmorillonites. The results show the montmorillonite observed (hkl) file is generally applicable (i.e., universal), and can be used to quantify montmorillonite in any mineral without modification or chemical treatment of the sample. Two halfwidth functions were used for the montmorillonite, corresponding to the sharp (hk0) and broad (hkl) classes of reflections. A March preferred orientation parameter for montmorillonite was also refined.

Type
Research Article
Information
Powder Diffraction , Volume 9 , Issue 2 , June 1994 , pp. 119 - 123
Copyright
Copyright © Cambridge University Press 1994

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