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X-Ray Absorption Spectroscopy as an in-situ Tool in Materials Science

Published online by Cambridge University Press:  10 February 2011

T. Ressler ,
Joe Wong  and
W. Metz
T. Ressler
Affiliation:
Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore, CA 94551, [email protected]
Joe Wong
Affiliation:
Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore, CA 94551, [email protected]
W. Metz
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Hamburg, Germany
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Abstract

In addition to being an established technique for ex-situ structural studies, x-ray absorption spectroscopy (XAS) has recently been realized to be a powerful tool for in-situ time-resolved investigations in materials science. This paper describes two complementary techniques: quick-scanning EXAFS (QEXAFS) and energy-dispersive XAS (DXAS) which offer time resolution in the seconds and milliseconds range, respectively. Formation of a heterogeneous catalyst from a solid-state reaction of a precursor is presented as an example of a time-resolved XAS application.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 502: Symposium II – In Situ Process Diagnostics & Intelligent Materials Processing , 1997 , 127
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Teo, B. K., EXAFS : Basic Principles and Data Analysis, Springer, New York (1986) D.C. Koningsberger, R. Prins, X-ray Absorption Spectroscopy, Chemical Analysis, 92, Wiley, New York (1988)Google Scholar
[2] Frahm, R.. Nucl. Instrum. Methods Phys. Res A, 270, 578, (1988); R. Frahm, Rev. Sci. Instrum. 60, 7, 2515 (1989); R. Frahm, J. Wong, Jpn. J. Appl. Phys., 32, 188 (1992)Google Scholar
[3] Hagelstein, M.; Cunis, S.; Frahm, R.; Niemann, W.; Rabe, P. Physica B, 158, 324 (1989); Hagelstein, M.; Ferrero, C.; Hatje, U.; Ressler, T.; Metz, W. J. Synchrotron Rad., 2, 174 (1995); T. Ressler, M. Hagelstein, U.Hatje, W. Metz, J. Phys. Chem. B, 101, 6680 (1997)Google Scholar
[4] Behrens, P., Metz, W., Synth. Met., 23, 81 (1988)Google Scholar
[5] Sirokman, G., Carbon, 26, 35 (1990)Google Scholar
[6] Eickhoff, H. P., Ph.D. Thesis, University of Hamburg, Germany (1993)Google Scholar
[7] Lochte, K., Ph.D. Thesis, University of Hamburg, Germany (1994)Google Scholar
[8] Boeck, A., Ruedorff, W., Anorg, Z.. Allg. Chem., 392, 236 (1972)Google Scholar
[9] Griebel, H., Ehrhardt, C., Stumpp, E., Materials Science Forum, 91–93, 283 (1992)Google Scholar