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Surface Structures and Rearrangements in Oxides

Published online by Cambridge University Press:  21 February 2011

M. R. Mccartney
Affiliation:
Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona 85287
David J. Smith
Affiliation:
Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona 85287
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Abstract

Electron-beam-induced surface reactions and rearrangements have been observed for a number of oxides including MgO, TiO2, SrTiO3 and SnO2 using conventional and ultra-high-vacuum high-resolution electron microscopes. Electron irradiation of TiO2 resulted in a variety of effects including reduction, re-oxidation and amorphization. SnO2 was observed to form facets readily during high-resolution imaging but it was stable against reduction except when exposed to extreme current densities which caused the formation of metallic tin crystals. Electron irradiation of MgO under UHV conditions resulted in the formation of facetted pits. The surfaces of SrTiO3 were stable for moderate electron dose rates but rapidly amorphized when irradiated at extreme current densities.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1. Smith, D.J., McCartney, M.R. and Bursill, L.A., Ultramicroscopy 23, 299 (1987).Google Scholar
2. Buckett, M. I., Strane, J., Luzzi, D.E., Zhang, J.P.. Wessels, B.W. and Marks, L.D., Ultramicroscopy 29, 217 (1989).Google Scholar
3. McCartney, M.R. and Smith, D.J., Surface Sci. 221, 214 (1989).Google Scholar
4. McCartney, M. R., Crozier, P.A., Weiss, J.K. and Smith, D.J., Vacuum, in press.Google Scholar
5. Smith, D.J., Podbrdsky, J., Swann, P.R. and Jones, J.S. in High Resolution Microscopy of Materials, edited by Krakow, W., Ponce, F.A. and Smith, D. J. (Mater. Res. Soc. Proc. 139, Boston, MA 1989) pp. 289294.Google Scholar