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The Stress State and Domain Structure of Epitaxial PbZr0.2Ti0.8O3 Films on (001) SrTiO3 with and without La0.5Sr0.5CoO3 Electrode Layer

Published online by Cambridge University Press:  10 February 2011

S.P. Alpay ,
V. Nagarajan ,
L.A. Bendersky ,
M.D. Vaudin ,
S. Aggarwal ,
R. Ramesh  and
A.L. Roytburd
S.P. Alpay
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland, 20742
V. Nagarajan
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland, 20742
L.A. Bendersky
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899
M.D. Vaudin
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland, 20899
S. Aggarwal
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland, 20742
R. Ramesh
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland, 20742
A.L. Roytburd
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, Maryland, 20742
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Abstract

The domain structure of the 400 nm thick PbZr0.2Ti0.8O3 (PZT) films with different electrode layer configurations was investigated by x-ray diffraction and transmission electron microscopy. The c-domain fractions of the PZT films with no electrode layer, with a 50 nm electrode layer between the film and the substrate, and with 50 nm electrode layers on top and bottom of the PZT film were found to be equal. This means that depolarizing fields do not affect the polydomain structure of the film. Calculations of the in-plane strains based on the lattice parameters of the La0.5Sr0.5CoO3 (LSCO) layer in the above configurations led to the conclusion that the bottom electrode layer is coherently strained to match the substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 541: Symposium O – Ferroelectric Thin Films VII , 1998 , 357
Copyright
Copyright © Materials Research Society 1999

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References

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