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Rheed Intensity Monitored Growth of Bi-Sr-Ca-Cu-O Superconductors

Published online by Cambridge University Press:  26 February 2011

Shigeki Sakai ,
Yuji Kasai ,
Peter Bodin  and
Hirofumi Matsuhata
Shigeki Sakai
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Yuji Kasai
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Peter Bodin
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
Hirofumi Matsuhata
Affiliation:
Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba-shi, Ibaraki 305, Japan.
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Abstract

To make Bi2Sr2CaCu2O8 superconducting films with top insulating SrTiO3, we use the molecular beam epitaxy technique (MBE) with in situ monitoring by reflection high-energy electron diffraction (RHEED). A new (RHEED)image enhancing technique, difference reflection high-energy electron diffraction (DRHEED) gave striking information on the growth process of each layer in the Bi:2212 compound as well as the rough and flat transition occurring during co-evaporated deposition of SrTi03.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 73
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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