Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T14:24:15.421Z Has data issue: false hasContentIssue false
  • English
  • Français

Observation Of Real-Time Thin Film Evolution Using Microcantilever Sensors

Published online by Cambridge University Press:  25 March 2011

Alan M. Schilowitz  and
Dalia G. Yablon
Alan M. Schilowitz
Affiliation:
Corporate Strategic Research, ExxonMobil Research and Engineering Annandale, NJ 08801
Dalia G. Yablon
Affiliation:
Corporate Strategic Research, ExxonMobil Research and Engineering Annandale, NJ 08801
Get access

Abstract

Adsorption and desorption kinetics of thin film formation on metal surfaces has been directly monitored in real-time by optically measuring the deflection of activated atomic force microscope microcantilevers. Microcantilever deflection is caused by stress generated during the formation of an adsorbate layer on one side of the microcantilever. In this work, rapid adsorption of carboxylic acid in hydrocarbon solvent onto a gold surface was directly observed as a compressive stress developed on the microcantilever substrate. Upon exposure to alkylthiol, acid desorbed and was displaced by alkylthiol; this process was continuously monitored in real-time. Experiments suggest that some film organization and intermolecular interaction are required before substantial surface stress can be detected.

Keywords

sensoradsorptionscanning probe microscopy (SPM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-uu04-08-ss4-08
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Thundat, T.; Oden, P.I.; Warmack, R.J. Micro. Thermophys. Eng. 1997, 1, 185–199.Google Scholar
[2] Wachter, E.A.; Thundat, T. Rev. Sci. Instrum. 1995, 66, 3662–3667.Google Scholar
[3] Khaled, A.R.A.; Vafai, K.; Yang, M.; Zhang, X.; Ozkan, C.S. Sens. Actuators, B, Chem. 2003, 94, 103–115.Google Scholar
[4] Cherian, S.; Thundat, T. Appl. Phys. Lett. 2002, 80, 2219–2221.Google Scholar
[5] O’Shea, S.J.; Welland, M.E.; Brunt, T.A.; Ramadan, A.R.; Rayment, T. J. Vac. Sci. Technol. B, 1996, 14, 1383–1385.Google Scholar
[6] Berger, R.; Delamarche, E.; Lang, H.P.; Gerber, Ch.; Gimzewski, J.K.; Meyer, E.; Guntherodt, H.J. Science, 1997, 276, 2021–2024.Google Scholar
[7] Berger, R.; Delamarche, E.; Lang, H.P.; Gerber, Ch.; Gimzewski, J.K.; Meyer, E.; Guntherodt, H.J. Appl. Phys. A, 1998, 66, S55–S59.Google Scholar
[8] Datskos, P.G.; Sauers, I. Sens. Actuators, B, Chem, 1999, 61, 75–82.Google Scholar
[9] Wetterer, S.M.; Lavrich, D.J.; Cummings, T.; Bernasek, S.L.; Scoles, G. J. Phys. Chem. B 1998, 102, 9266–9275.Google Scholar
[10] Karpovich, D.S., Schessler, H.M., Blanchard, G.J., Thin Films, Academic Press NY, 1998, 24, 44-81.Google Scholar