Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-24T10:38:21.108Z Has data issue: false hasContentIssue false
  • English
  • Français

Iron substituted SrRuO3 thin films

Published online by Cambridge University Press:  01 February 2011

Aman Ullah ,
Young Zo Yoo ,
Omar Chmaissem ,
Stanislaw Kolesnik ,
Bogdan Dabrowski  and
Genis Alan
Aman Ullah
Affiliation:
[email protected], Northern Illinois University, Physics, 202 Faraday West, Dekalb, IL, 60115, United States, (815) 753-1772, (815) 753-8565
Young Zo Yoo
Affiliation:
[email protected], Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Omar Chmaissem
Affiliation:
[email protected], Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Stanislaw Kolesnik
Affiliation:
[email protected], Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Bogdan Dabrowski
Affiliation:
[email protected], Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Genis Alan
Affiliation:
[email protected], Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Electrical Engineering, Dekalb, IL, 60115, United States
Get access

Abstract

Fe-doped SrRuO3 thin films were grown on SrTiO3 (STO) substrates by using the Pulse Laser Deposition (PLD) method. Fe concentrations in the SrRuO3 thin films ranged from 0 % to 11 % to manifest the effect of Fe doping on their microstructure. Lattice constants of the films did not show obvious changes with the Fe doping whereas surface morphologies drastically changed from stepped to island structure with increasing Fe. X-ray reflectivity revealed that the surface and interfacial roughness decreased with increasing concentration of Fe. Surface roughness of the films was confirmed by atomic force microscopy. Therefore, a precise determination of film roughness as well as its growth mechanism using X-ray and AFM is exploited to correlate the Fe doping with structural disorder.

Keywords

thin filmx-ray reflectivitylaser ablation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 962: Symposium P – Nanoscale Magnets – Synthesis, Self-Assembly, Properties and Applications , 2006 , 0962-P10-24
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Yoo, Y. Z., Chmaissem, O., Kolesnik, S., Ullah, A., Lurio, L. B., Brown, D. E., Brady, J., Dabrowski, B., Kimball, C. W., Haji-Sheikh, M., and Genis, A. P., Applied Physics Letters 89 (2006)Google Scholar
[2] Kolesnik, S., Yoo, Y. Z., Chmaissem, O., Dabrowski, B., Maxwell, T., Kimball, C. W., and Genis, A. P., Journal Of Applied Physics 99 (2006)Google Scholar
[3] Palasantzas, G., Zhao, Y. P., De Hosson, J. T. M., and Wang, G. C., Physica B 283 (2000) 199.Google Scholar