Hostname: page-component-745bb68f8f-grxwn Total loading time: 0 Render date: 2025-02-04T18:04:32.495Z Has data issue: false hasContentIssue false
  • English
  • Français

Interface Stress and an Apparent Negative Poisson's Ratio in Ag/Ni Multilayers

Published online by Cambridge University Press:  10 February 2011

K. O. Schweitz ,
H. Geisler ,
J. Chevallier ,
J. Bøttiger  and
R. Feidenhans'l
K. O. Schweitz
Affiliation:
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark, [email protected]
H. Geisler
Affiliation:
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark, [email protected]
J. Chevallier
Affiliation:
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark, [email protected]
J. Bøttiger
Affiliation:
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark, [email protected]
R. Feidenhans'l
Affiliation:
Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark
Get access

Abstract

By use of dc-magnetron sputtering, (111) textured Ag/Ni multilayered thin films were deposited with nominal bilayer repeat lengths ranging from 2 nm to 250 nm. Bulk and interface stresses were obtained from X-ray diffraction and measurements of substrate curvatures. Both in-plane and out-of-plane expansions were observed in the Ni layers, and a compressive interface stress of −2.24±0.21 J/m2 was found. This is in agreement with a previously published result of the interface stress in Ag/Ni thin films which had, as opposed to the present multilayers, a high level of total stress.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 505 , 1997 , 559
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

1

present address: Institut für Werkstoffwissenschaft, Technische Universität Dresden, D-01062 Dresden, Germany

References

REFERENCES

1.Greer, A. and Spaepen, F., Synthetic Modulation Structures, edited by Chang, L. and Giessen, B. (Academic Press, New York, 1985), p. 419.Google Scholar
2.J. Magn. Magn. Mater. 156 (1996).Google Scholar
3.Baibich, M. N., Broto, J. M., Fert, A., Dau, F. N. Van, Petroff, F., Eitenne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
4.Structure and Properties of Multilayered Thin Films, edited by Nguyen, T. D., Lairson, B. M., Clemens, B. M., Shin, S.-C. and Sato, K. (Mater. Res. Soc. Proc. 382, San Francisco, CA, 1995).Google Scholar
5.Ruud, J. A., Witvrouw, A. and Spaepen, F., J. Appl. Phys. 74, 2517 (1993).Google Scholar
6.Berger, S. and Spaepen, F., Nanostruct. Mater. 6, 201 (1995).Google Scholar
7.Shull, A. L. and Spaepen, F., J. Appl. Phys. 80 (11), 6243 (1996).Google Scholar
8.Gumbsch, P. and Daw, M., Phys. Rev. B 44, 3934 (1991).Google Scholar
9.Geisler, H., Schweitz, K. O., Chevallier, J., Bøttiger, J. and Samwer, K., Submitted to Phil. Mag.Google Scholar
10.Hansen, M. and Anderko, K., Consttution of Binary Alloys, (McGraw-Hill, New York, 1958), p. 14.Google Scholar
11.Stoney, G., Proc. R. Soc. London Ser A 82, 172 (1909).Google Scholar
12.Nedialkov, M., Zinenko, V. and Karpuzov, D., Vacuum 46, 1455 (1995).Google Scholar
13.Fullerton, E. E., Schuller, I., Vanderstraeten, H. and Bruynseraede, B., Phys. Rev. B 45, 9292 (1992).Google Scholar
14.Fullerton, E. E., Guimpel, J., Nakamura, O. and Schuller, I. K., Phys. Rev. Lett. 69, 2859 (1992).Google Scholar
15.Fullerton, E. E., Pearson, J., Sowers, C. H., Bader, S. D., Wu, X. Z. and Sinha, S. K., Phys. Rev. B 48, 17432 (1993).Google Scholar
16.Cammarata, R. C., Progr. Surf. Sci. 46, 1(1994).Google Scholar
17.Vineyard, G. H., Phys. Rev. B 26, 4146 (1982).Google Scholar
18.Fartash, A., Grimsditch, M., Fullerton, E. E. and Schuller, I. K., Phys. Rev. B 47, 12813 (1993).Google Scholar
19.Huntington, H., Solid State Phys. 7, 274 (1958).Google Scholar
20.Nix, W., Metall. Trans. A 20, p. 2217 (1989).Google Scholar
21.Bechmann, R., Hearmon, R. F. S., and Kurtz, S. K., Landolt-Böbrnstein Numerical Data and Functional Relationships in Science and Technology: Group III, (Springer, Berlin, 1969), p. 112.Google Scholar
22.Josell, D. and Spaepen, F., Mater. Res. Soc. Symp. Proc. 239, 515 (1991).Google Scholar