Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T13:36:54.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Infrared detector activities at NASA Langley Research Center

Published online by Cambridge University Press:  01 February 2011

M. Nurul Abedin ,
Tamer F Refaat ,
Oleg V Sulima  and
Farzin Amzajerdian
M. Nurul Abedin
Affiliation:
[email protected], NASA Langley Research Center, Remote Sensing Flight Systems Branch, 5 N. Dryden Street, Hampton, VA, 23681, United States, 757-864-4814, 757-864-8828
Tamer F Refaat
Affiliation:
[email protected], Old Dominion University, Norfolk, VA, 23529, United States
Oleg V Sulima
Affiliation:
[email protected], University of Delawrae, Newark, DE, 19716, United States
Farzin Amzajerdian
Affiliation:
[email protected], NASA LaRC, Hampton, VA, 23681, United States
Get access

Abstract

Infrared detector development and characterization at NASA Langley Research Center will be reviewed. These detectors were intended for ground, airborne, and space borne remote sensing applications. Discussion will be focused on recently developed single-element infrared detector and future development of near-infrared focal plane arrays (FPA). The FPA will be applied to next generation space-based instruments. These activities are based on phototransistor and avalanche photodiode technologies, which offer high internal gain and relatively low noise-equivalent-power. These novel devices will improve the sensitivity of active remote sensing instruments while eliminating the need for a high power laser transmitter.

Keywords

III-Vdeviceselectronic material
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1076: Symposium K – Materials and Devices for Laser Remote Sensing and Optical Communication , 2008 , 1076-K03-04
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ambrico, P. Amodeo, A. Girolamo, P. and Spinelli, N. Applied Optics 39(36), 6847–6865 (2000).Google Scholar
2. Ismail, S. Koch, G. J. Barnes, B. W. Abedin, N. Refaat, T. F. Yu, J. Vay, S. A. Kooi, S. A., Browell, E. V. Singh, U. N. Proceedings of the 22nd International Laser Radar Conference, 65-68 (2004).Google Scholar
3. Refaat, T.F. Abedin, M.N. Sulima, O.V. Ismail, S. and Singh, U.N. Optical Engineering 43(7), 1647–1650 (2004).Google Scholar
4. Refaat, T.F. Abedin, M.N. Sulima, O.V. Singh, U.N. and Ismail, S. IEDM Tech. Dig., 355-358 (2004).Google Scholar
5. Diadiuk, V. Groves, S.H. Hurwitz, C.E. and Iseler, G.W. IEEE J. Quantum Electronics, QE-17 (2), 260–264 (1981).Google Scholar
6. Campbell, J.C. Dentai, A.G. Holder, W.S. and Kasper, B.L. Electron. Lett. 19, 818–820 (1983).Google Scholar
7. Loi, K.K. and Itzler, M. Compound Semiconductor 6(3), 1–3 (2000).Google Scholar
8. Sulima, O.V. Refaat, T.F. Mauk, M.G. Cox, J.A. Li, J. Lohokare, S.K. Abedin, M.N. Singh, U.N. and Rand, J.A. Electronics Letters 40, 766–767, (2004).Google Scholar
9. Sulima, O.V. Refaat, T.F. Mauk, M.G. Cox, J.A. Li, J. Lohokare, S.K. Abedin, M.N. Singh, U.N. and Rand, J.A. Presented at 6th Middle-Infrared Optoelectronics Materials and Devices (MIOMD) Conference, in St. Petersburg, Russia, 28 June-1 July 2004.Google Scholar
10. Abedin, M.N. Refaat, T.F. Sulima, O.V. and Singh, U.N. IEEE Trans. Electron Devices 51(12), 2013–2018 (2004).Google Scholar
11. Abedin, M.N. Refaat, T.F. Sulima, O.V. and Singh, U.N. International Journal of High Speed Electronics and Systems, v.15, No.2, pp. 567–582, (2006).Google Scholar
12. Refaat, T.F. Abedin, M.N. Sulima, O.V. Ismail, S. and Singh, U.N. Optical Engineering, v. 43, No. 7, pp.1647–1650 (2004).Google Scholar
13. Refaat, T.F. Abedin, M.N. Sulima, O.V. Singh, U.N. and Ismail, S. Technical Digest of the 50th IEEE International Electron Devices Meeting (IEDM), San-Francisco, Ca, December 2004, pp.355–358 (2004).Google Scholar
14. Refaat, T.F. Abedin, M. N. Sulima, O.V. Ismail, S. and Singh, U.N. Proc. SPIE, v.5887, pp.588706–1 (2005).Google Scholar
15. Sulima, O.V. Swaminathan, K. Refaat, T.F. Faleev, N.N. Semenov, A.N. V.A. Solov'ev, Ivanov, S.V. Abedin, M.N. Singh, U.N. and Prather, D. Electronics Letters, v.42 (1), pp. 55–56 (2006).Google Scholar
16. Dries, J.C. Martin, T. Huang, W. Lange, M.J. and Cohen, M. J. IEEE LEOS Proceedings, 2002.Google Scholar
17. Beck, J.D. Wan, C.-F., Kinch, M.A. and Robinson, J.E. SPIE v. 4454, pp. 188–197 (2001).Google Scholar