Published online by Cambridge University Press: 21 February 2011
Starting from electron microscope high resolution images we apply the technique of digital image processing to analyze some structural properties of oxides. We identify the structural features in the images that give origin to the diffuse scattering observed in the electron diffraction patterns of these oxides. We obtain results for three different systems: YBaCuO and BiSrCaCuO high temperature superconductors and mullite (type germanate). The analysis and enhancement of the images is done by filtering them in their Fourier space.