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Dielectric Characterization of Thin Films Consisting of Tin Doped Indium Oxide Nanoparticles

Published online by Cambridge University Press:  21 February 2011

A. Hultåker  and
G. A. Niklasson
A. Hultåker
Affiliation:
Department of Materials Science, Uppsala University, PO Box 534, SE-751 21 Uppsala, weden, [email protected]
G. A. Niklasson
Affiliation:
Department of Materials Science, Uppsala University, PO Box 534, SE-751 21 Uppsala, weden
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Abstract

In recent years there has been a growing interest in cheap and easy production techniques for transparent conducting thin films. One way of making these uses a nanoparticle dispersion. We prepared thin films of tin doped indium oxide by spin-coating of a solution of nanoparticles. The sintering behavior of these ceramic particles was studied by dielectric spectroscopy and by grazing incidence X-ray diffraction. The grain growth was found to start at 1000°C and to be prominent at 1250°C. However, the electrical conductivity reached a maximum below these temperatures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 581: Symposium F – Nanophase & Nanocomposite Materials II , 1999 , 491
Copyright
Copyright © Materials Research Society 2000

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