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Atomic Force Microscope Designs and Applications

Published online by Cambridge University Press:  21 February 2011

P. J. Bryant ,
R. G. Miller ,
R. H. Deeken  and
M. A. Pederson
P. J. Bryant
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. G. Miller
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. H. Deeken
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
M. A. Pederson
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
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Abstract

Atomic force microscopes (AFM) have been designed and tested. A simple reliable version with high resolving power is described here. Materials of construction and operational parameters are reported. Applications to a range of materials has confirmed the general usefulness of AFM technology to materials research.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 235
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Hansma, P.K., Elings, V.B., Marti, O., Bracker, C.E., Science, 242, 209–16 (1988).Google Scholar
2. Binnig, G., Quate, C. F. and Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986).Google Scholar
3. Binnig, G., Gerber, Ch., Stoll, E., Albrecht, T.R., and Quate, C.F., Europhys. Lett. 3, 1281 (1987).CrossRefGoogle Scholar
4. Yang, R., Miller, R., and Bryant, P.J., J. Appl. Phys. 63 (2) 570–2 (1988).CrossRefGoogle Scholar
5. Bryant, P.J., Miller, R.G., and Yang, R., Appl. Phys. Lett. 52 (26) 2233–5 (1988).Google Scholar
6. Bryant, P.J., Miller, R.G., Deeken, R., Yang, R. and Zheng, Y.C., Microscopy (to be published).Google Scholar
7. Bryant, P.J., Yang, R. and Miller, R., Trans. of the 1987 MRS Natl. Symp. (1988).Google Scholar