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Atomic Force Microscope Designs and Applications
Published online by Cambridge University Press: 21 February 2011
Abstract
Atomic force microscopes (AFM) have been designed and tested. A simple reliable version with high resolving power is described here. Materials of construction and operational parameters are reported. Applications to a range of materials has confirmed the general usefulness of AFM technology to materials research.
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- Research Article
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- Copyright © Materials Research Society 1989