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Optical Properties of CdS and CdTe Sensitized ZnO Nanorods

Published online by Cambridge University Press:  10 June 2014

C. J. Pereyra
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
F. Ferrer
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
R. E. Marotti
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
C. Gómez
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
L. Campo
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
L. I. Amy
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
F. Martín
Affiliation:
Lab. de Materiales y Superficies (Unidad Asociada al CSIC), Dptos. de Física Aplicada & Ingeniería Química, Universidad de Málaga, Campus de Teatinos s/n, E29071 Málaga, Spain.
D. Leinen
Affiliation:
Lab. de Materiales y Superficies (Unidad Asociada al CSIC), Dptos. de Física Aplicada & Ingeniería Química, Universidad de Málaga, Campus de Teatinos s/n, E29071 Málaga, Spain.
J. R. Ramos-Barrado
Affiliation:
Lab. de Materiales y Superficies (Unidad Asociada al CSIC), Dptos. de Física Aplicada & Ingeniería Química, Universidad de Málaga, Campus de Teatinos s/n, E29071 Málaga, Spain.
E. A. Dalchiele
Affiliation:
Instituto de Física & CINQUIFIMA, Facultad de Ingeniería, Universidad de la República, Montevideo, Uruguay.
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Abstract

Optical properties of ZnO-CdTe electrochemically prepared on a core-shell nanostructure (NS) were studied. Numerical simulations based on effective medium approximation give higher absorption than ZnO-CdS samples and a sensitive dependence on CdTe content. The absorption edges for deep black samples found by transmittance (T(λ)) and diffuse reflectance (Rdiff(λ)) measurements were at 1.33eV and 1.55eV, respectively. A split-off band edge was also found by Rdiff(λ) at ∼2.5eV. The red shift observed in T(λ), previously observed in ZnO-CdS, and may confirm the enhancement of sub-bandgap absorption due to the NS nature of samples.

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Articles
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Ozgür, Ü.,Alivov, Y. I., Liu, C., Teke, A., Reshchikov, M. A., Doğan, S., Avrutin, V., Cho, S.-J., and Morkoc¸, H.; J. Appl. Phys. 98, 041301 (2005).CrossRefGoogle Scholar
Musselman, K. P., Wisnet, A., Iza, D. C., Hesse, H. C., Scheu, C, MacManus-Driscoll, J. L., and Schmidt-Mende, L., Adv. Mater 22, E254 (2010).CrossRefGoogle Scholar
Kayes, B. M., Atwater, H. A., and Lewis, N. S., J. Appl. Phys. 97 114302 (2005).CrossRefGoogle Scholar
Guerguerian, G., Elhordoy, F., J Pereyra, C., Marotti, R. E, Martín, F., Leinen, D., Ramos-Barrado, J. R., and Dalchiele, E. A., Nanotechnology 22, 505401 (2011).CrossRefGoogle Scholar
Campo, L., Pereyra, C. J., Amy, L., Elhordoy, F., Marotti, R. E., Martín, F., Ramos-Barrado, J. R., and Dalchiele, E. A., ECS J. Solid State Sci. and Technol. 2, Q151 (2013).CrossRefGoogle Scholar
Pereyra, C. J., Marotti, R. E., Guerguerian, G., Elhordoy, F., Campo, L., Amy, L., Gau, D., Martín, F., Leinen, D., Ramos-Barrado, J., and Dalchiele, E. A., Energy Environ. Focus 2, 257 (2013).CrossRefGoogle Scholar
Guerguerian, G., Elhordoy, F., Pereyra, C. J, Marotti, R. E, Martín, F., Leinen, D., Ramos-Barrado, J. R., and Dalchiele, E. A., J. Phys. D: Appl. Phys. 45, 245301 (2012).CrossRefGoogle Scholar
Fan, Z., Ruebusch, D. J., Rathore, A. A., Kapadia, R., Ergen, O., Leu, P. W., and Javey, A., Nano Res. 2, 829 (2009).CrossRefGoogle Scholar
Yu, R., Lin, Q., Leung, S.-F., and Fan, Z., Nano Energy 1, 57 (2012).CrossRefGoogle Scholar
Rabinovich, E. and Hodes, G., J. Phys. Chem. C. 117, 1611 (2013).CrossRefGoogle Scholar
Khan, Z. R., Zulfequar, M., and Khan, M. S., Bull. Matter. Sci. 35, 2, 169 (2012).CrossRefGoogle Scholar
Lalitha, S., Karazhznov, S. Zh.,Ravindran, P., Senthilarasu, S., Sathyamoorthy, R., and Janabergenov, J., Physica B. 387, 227 (2007).CrossRefGoogle Scholar
Al-Douri, A. A. J., Al-Shakily, F. Y., Alias, M. F. A., and Alnejjar, A. A., Adv. Cond. Matt. Phys. 647684 (2010).Google Scholar
Adachi, S., Kimura, T., and Suzuki, N., J. Appl. Phys. 74, 3435 (1993).CrossRefGoogle Scholar
Paulson, P. D. and Mathew, X., Sol. Ener. Mat. Sol. Cells, 82, 279 (2004).CrossRefGoogle Scholar
Niles, D. W. and Hochst, H., Phys Rev. B 43, 1492 (1991).CrossRefGoogle Scholar
McCandless, B. E. and Sites, J. R., Handbook of Photovoltaic Science and Engineering edited by Luque, A. and Hegedus, S. (John Wiley & and Sons, West Sussex, 2003) p. 618.Google Scholar
Bojorge, C. D., Kent, V. R., Teliz, E., Cánepa, H. R., Henríquez, R., Gómez, H., Marotti, R. E., and Dalchiele, E. A., Phys. Status Solidi A 208, 1662 (2011).CrossRefGoogle Scholar
Stenzel, O., The Physics of Thin Film Optical Spectra – An Introduction (Springer-Verlag, Berlin, 2005) p. 51 and p. 104.Google Scholar
Nichelatti, E., J. Opt. A: Pure Appl. Opt. 4, 400 (2002).CrossRefGoogle Scholar
Liu, Y. C., Tung, S. K., and Hsiek, J. H., J. Cryst. Growth. 287, 105 (2006).CrossRefGoogle Scholar
Powder Diffraction File, Joint Committee for Powder Diffraction Studies (JCPDS) File No. 05–0664 (hexagonal structure of ZnO).Google Scholar
Powder Diffraction File, Joint Committee for Powder Diffraction Studies (JCPDS) File No. 01-089-0440 (cubic structure of CdS).Google Scholar
Powder Diffraction File, Joint Committee for Powder Diffraction Studies (JCPDS) File No. 15–0770 (cubic structure of CdTe).Google Scholar
Tauc, J., Mater. Res. Bull. 5, 721 (1970).CrossRefGoogle Scholar
Marotti, R. E., Badán, J. A., Quagliata, E., and Dalchiele, E. A., Physica B 398, 337 (2007).CrossRefGoogle Scholar
Johnson, S. R. and Tiedje, T., J. Appl. Phys. 78, 5609 (1995).CrossRefGoogle Scholar
Torrent, J. and Barrón, V., in Encyclopedia of Surface and Colloid Science, edited by Hubbard, A. T., 2 nd ed. (CRC Press, New York, 2002) p. 1438.Google Scholar
Schröderand, U. and Scholz, F., J. Solid State Electrochem. 1, 62 (1997).Google Scholar
Hagamuchi, C., Basic Semiconductor Physics, 2 nd ed. (Springer-Verlag, Berlin, 2010) p. 51.CrossRefGoogle Scholar