Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T14:22:48.281Z Has data issue: false hasContentIssue false

Nano-scale Conductive Films for High Performance Fine Pitch Interconnect

Published online by Cambridge University Press:  01 February 2011

Yi Li
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, Atlanta GA 30332-0245, United States
Myung Jin Yim
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, 771 Ferst Drive, Atlanta, GA, 30332, United States
Kyung Sik Moon
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, Atlanta, GA, 30332-0245, United States
ChingPing Wong
Affiliation:
[email protected], Georgia Institute of Technology, School of Materials Science and Engineering, Atlanta, GA, 30332-0245, United States
Get access

Abstract

In this paper, a novel nano-scale conductive film which combines the advantages of both traditional anisotropic conductive adhesives/films (ACAs/ACFs) and nonconductive adhesives/films (NCAs/NCFs) is introduced and developed for next generation high performance ultra-fine pitch packaging applications. This novel interconnect film possesses the properties of electrical conduction along the z-direction with relatively low bonding pressure (ACF-like) and the ultra-fine pitch (< 100 nm) capability (NCF-like). Unlike typical ACF which requires 1–5 vol% of conductive fillers, the novel nano-scale conductive film only needs less than 0.1 vol% conductive fillers to achieve good electrical conductance in the z direction. The nano-scale conductive film also allows a lower bonding pressure than NCF to achieve a much lower joint resistance (over two orders of magnitude lower than typical ACF joints) and higher current carrying capability. With low temperature sintering of nano-silver fillers, the joint resistance of the nano-scale conductive film could be as low as 10−5 Ohm, even lower than the NCF and lead-free solder joints. The reliability of the nano-scale conductive film after high temperature and humidity test (85°C/85%RH) was also improved compared to the NCF joints. As such, a high performance, fine pitch conductive film was developed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Li, Y., Moon, K., Wong, C. P., Science 308 (2005) 14191420.Google Scholar
2 Li, Y., Wong, C. P., Mater. Sci. and Engin. R 51 (2006) 135.Google Scholar
3 Hwang, J. S., (Ed.) Environment-Friendly Electronics: Lead-free Technology, Electrochemical Publications Ltd., Port Erin, UK, 2001; Chapter 1, pp410.Google Scholar
4 Lau, J., Wong, C. P., Lee, N. C., Lee, S. W. R., in Electronics Manufacturing: with Lead-Free, Halogen-Free, and Conductive-Adhesive Materials; McGraw Hill, New York, NY, 2002.Google Scholar
5 Liu, J., (Ed.) Conductive adhesives for Electronics Packaging (Electrochemical Publications Ltd.Isle of Man, British Isles, 1999), Chapter 1.Google Scholar
6 Zhong, Z. W., J. Elec. Packg., 127(1) (2005) 2932.Google Scholar
7 Cheng, H.C., Ho, C.L., Chiang, K.N. and Chang, S.M., IEEE Trans. Comp. Packg. Technol., 27(2) (2004) 398410.Google Scholar
8 Li, Y., Moon, K. and Wong, C. P., J. Electron. Mater., 34–3 (2005) 266271.Google Scholar
9 Li, Y., Moon, K., and Wong, C. P., J. Electron. Mater., 34–12 (2005) 15731578.Google Scholar
10 Li, Y., Moon, K., and Wong, C. P., J. Appl. Polym. Sci., 99–4 (2006) 16651673.Google Scholar
11 Li, Y., Moon, K., Wong, C.P., U.S. Patent pending.Google Scholar