Hostname: page-component-745bb68f8f-b6zl4 Total loading time: 0 Render date: 2025-01-27T03:12:20.618Z Has data issue: false hasContentIssue false
  • English
  • Français

Method for the Reduction of Photothermal Deflection Spectroscopy Data Taken on Amorphous Silicon (a-Si:H)

Published online by Cambridge University Press:  26 February 2011

S. Wiedeman ,
M. S. Bennett  and
J. L. Newton
S. Wiedeman
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
M. S. Bennett
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
J. L. Newton
Affiliation:
Solarex Corporation, 826 Newtown-Yardley Road, Newtown, PA 18940 USA
Get access

Abstract

Photothermal deflection spectroscopy (PDS) is a sensitive method used to measure weak optical absorption of sub-bandgap radiation. A method utilizing Fourier transformation is presented which allows removal of optical interference effects and noise which is typically present in PDS data taken on a-Si:H, yet leaves the underlying PDS spectra undistorted. The method greatly facilitates comparison of PDS spectra taken on different samples, and simplifies further analysis. Examples using a-Si samples produced under different deposition conditions are presented to demonstrate the utility of the method.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 95: Symposium E – Amorphous Silicon Semiconductors--Pure and Hydrogenated , 1987 , 145
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Jackson, W.B., Amer, N.M., Boccara, A.C., and Fournier, D., Appl. Opt. 20, 1333 (1981).Google Scholar
2. Jackson, W.B., Biegelsen, D.K., Nemanich, R.J., and Knights, J.C., Appl. Phys. Lett. 42, 105 (1983).Google Scholar
3. Bennett, M.S., Newton, J.L., Arya, R.R., Rajan, K., in Proc. of 18th IEEE Photovoltaic Specialists Conf. (Las Vegas, 1985) p. 1569.Google Scholar
4. Bennett, M.S., Wiedeman, S., Rajan, K., Smoot, M., in Mat. Res. Soc. Symp. Proc. Vol.94, edited by Adler, D., Madan, A., Thompson, M. and Hamakawa, Y. (MRS, Pittsburg, 1987) (to be published).Google Scholar
5. Skumanich, A., Amer, N.M., Jackson, W.B., Phys. Rev. B 31, 2263 (1985).Google Scholar