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Lateral Manipulation of Single Adsorbates and Substrate Atoms With the Scanning Tunneling Microscope

Published online by Cambridge University Press:  29 November 2013

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The stability and precision of modern scanning-tunneling-microscope (STM) systems allow positioning of the tip on a subnanometer scale. This advancement has stimulated diverse efforts on surface modifications in the nanometer and even atomic range, as recently reviewed by Avouris. The lateral movement of individual adatoms and molecules in a controlled manner on solid surfaces and the construction of structures on a nanoscale were first demonstrated by Eigler and collaborators at 4 K. The reason for operating the STM at low temperatures (apart from increased stability and sensitivity of the STM setup itself) is the necessity to freeze the motion of single adsorbates, which are very often mobile at ambient temperatures. By selecting strongly bonded adsorbate/substrate combinations and large molecules, it was possible to extend the lateral manipulation technique even to room temperature. In the case of large molecules, not only their translational motion but also internal flexure of the molecule during the positioning process must be considered. In general, different physical and chemical interaction mechanisms between tip and sample can be exploited for atomic-scale manipulation. We will concentrate in the following on lateral manipulation where solely the forces that act on the adsorbate because of the proximity of the tip are used. This means that long-range van der Waals and short-range chemical forces can be used to move atoms or molecules along the surface. No bias voltage or tunneling current is necessary. Apart from this technique, additional advances using the effects caused by the electric field generated by the bias voltage between tip and sample and by the current flowing through the gap region can be used for atomic or molecular modification.

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Copyright © Materials Research Society 1998

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References

1.Avouris, P., Acc. Chem. Res. 28 (1995) p. 95 and References therein.CrossRefGoogle Scholar
2.Stroscio, J.A. and Eigler, D.M., Science 254 (1991) p. 1319;CrossRefGoogle Scholar
Crommie, M.F., Lutz, C.P., and Eigler, D.M., Science 262 (1993) p. 218.CrossRefGoogle Scholar
3.Jung, T.A., Schüttler, R.R., Tang, H., Joachim, C., and Gimzewski, J.K., Science 271 (1991) p. 181.CrossRefGoogle Scholar
4.Beton, P.H., Dunn, A.W., and Moriarty, P., Surf. Sci. 361/362 (1996) p. 878;CrossRefGoogle Scholar
Mo, Y.W., Science 261 (1993) p. 886.CrossRefGoogle Scholar
5.Tersoff, J. and Hamann, D.R., Phys. Rev. Lett. 50 (1983) p. 1998.CrossRefGoogle Scholar
6.Ishi, S., Ohno, Y., and Viswanathan, B., Surf. Sci. 161 (1985) p. 349.CrossRefGoogle Scholar
7.Meyer, G., Neu, B., and Rieder, K.H., Chem. Phys. Lett. 240 (1995) p. 379.CrossRefGoogle Scholar
8.Meyer, G., Zophel, S., and Rieder, K.H., Phys. Rev. Lett. 77 (1996) p. 2113.CrossRefGoogle Scholar
9.Meyer, G., Neu, B., and Rieder, K.H., Appl. Phys. A 60 (1995) p. 343.CrossRefGoogle Scholar
10.Nagi, C., Haller, O., Platzgummer, E., Schmid, M., and Varga, P., Surf. Sci. 321 (1994) p. 237.Google Scholar
11.Bartels, L., Meyer, G., and Rieder, K.H., Phys. Rev. Lett. 79 (1997) p. 697.CrossRefGoogle Scholar
12.Bouju, X., Girard, Ch., Tang, H., Joachim, C., and Pizzagalli, L., Phys. Rev. B 55 (1997) p. 16498;CrossRefGoogle Scholar
Ciraci, S., Tekman, E., Baratoff, A., and Batra, I.P., Phys. Rev. 46 (1992) p. 10411.CrossRefGoogle Scholar
13.Meyer, G., Bartels, L., Zöphel, S., Henze, E., and Rieder, K.H., Phys. Rev. Lett. 78 (1997) p. 1512.CrossRefGoogle Scholar
14.Wang, S.C., and Ehrlich, G., Phys. Rev. Lett. 70 (1993) p. 41;CrossRefGoogle Scholar
Schwoebel, R.L., J. Appl. Phys. 40 (1969) p. 614.CrossRefGoogle Scholar
15.Stoltze, P., J. Phys. Cond. Matter 6 (1994) p. 9495.CrossRefGoogle Scholar
16.Koetter, E., Drakova, D., and Doyen, G., Surf. Sci. 331–333 (1995) p. 679.CrossRefGoogle Scholar