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An effect of depth of focus on micrometric analysis

Published online by Cambridge University Press:  14 March 2018

R. B. Elliott
R. B. Elliott*
Affiliation:
Department of Geology, The University, Nottingham
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Summary

When using many patterns of integrating stage the depth of focus is so great that it is not possible to distinguish between the upper and lower surfaces of a thin section; this may introduce serious errors into micrometric analyses. A procedure to meet this difficulty is suggested.

Type
Research Article
Information
Mineralogical magazine and journal of the Mineralogical Society , Volume 31 , Issue 234 , September 1956 , pp. 272 - 275
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1956

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References

Chayes, (F.), 1953. Min. Mag., Vol. 30, p. 147.Google Scholar
Chayes, (F.), 1954. Journ. Geol., Chicago, Vol. 62, p. 92.CrossRefGoogle Scholar
Elliott, (R. B.), 1952. Min. Mag., Vol. 29, p. 833.Google Scholar
Rayleigh, (Lord), 1896. Phil. Mag., ser. 5, Vol. 42, p. 167.Google Scholar