Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Microscopy and Characterization of Ceramics, Polymers, and Composites

Abstract

A Multi-Step Transmission Electron Microscopy Sample Preparation Technique for Indented Ceramics having Extensive Sub-Surface Cracking

Effect of Nitrogen Content on the Microstructure and Hardness of Hard Zr–B–C–N Films

Nanocharacterization and Electrical Properties of Grain Boundaries in Gd/Pr Doubly-Doped Ceria

Determining the Source of Water Vapor in a Cerium Oxide Electrochemical Oxygen Separator to Achieve Aviator Grade Oxygen.

TEM/STEM Analysis of NiO Reduction to Ni during Annealing in H2 Atmosphere

Low Energy TEM Characterizations of Ordered Mesoporous Silica-Based Nanocomposite Materials for Catalytic Applications

Highly Active CeO2 Nanorods Support for CO Oxidation

Investigation of the Nature and Mechanism of Resistive Switching in TiO2-x

Oxygen Exchange Kineics of Thin Ftilms Studied by Optical Transmission Relaxation: Correlation with Surface Composition and Microstructure

Microstructural Investigations of Platinum Shape Equilibration in Alumina

Grain Boundary Engineering at the Interface of Ceramic and Composite Materials used in Alternative Energy Technologies

High Resolution Electron Microscopy Characterization of (La0.5Sr0.5)2CoC4 Thin Film Cathode Materials

The Role of Microscopy in Understanding Ceramic Processing

Atomic Structure Determination of Ba4Ti5O10 and Ba4Ti4O11 in Epitaxial Barium Titanate Nanodomains Using HRTEM and Electron Diffraction

Direct Observation of Atomic Surface Structures of CeO2 Nanoparticles

Synthesis of Silver Doped TiO2 Nanostructured Composites for Photocatalytic Applications

High Speed SPM for Novel Property Mapping of Functional Ceramics

Multilayered Cr(Al)N/SiOx Nanocomposite Coatings Fabricated by Differential Pumping Cosputtering

Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS

Anti-Polar Ordering in Polycrystalline Samarium Doped BiFeO3

Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Microscopy and Characterization of Ceramics, Polymers, and Composites

Abstract