Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Imaging and Analysis of Cultural Heritage Materials

Abstract

World War II Airplane Models Advise Long-Term Behavior of Injection Molded Cellulose Acetate Plastic: Visualizing Stress

Non-Destructive Elemental Analysis of High-Value Artifacts With Micro-XRF

Unusual Pigments Found in a Painting by Giotto (1266-1337) Reveal Diversity of Materials Used by Medieval Artists

Analysis of Molded and Coreformed Glass from 1st Millennium BC Gordion, Anatolia

Characterisation of 20th Century Metallic Paint in Works of Art

A Non-Invasive Portable XRF System for Cultural Heritage Analyses

A New Synchrotron Approach to Study Ancient Materials: UV/Visible Photoluminescence Micro-Imaging

Multiple Layers in Black Gloss as Evidence of Multiple Firings

Decomposing Apricots: Tracking Transformation of Arsenic Sulfide pigments in a Dutch Golden Age Still-life.

Micro XRF Imaging of Daguerreotypes

Detecting Iron-based Pigments on Ruthenium-coated Archaeological Pottery by SEM-EDS and by Micro-XRF-SEM

Nanometer-Scale Proximal Probe Thermal Desorption Coupled with Laser Mass Spectrometry

Investigation on Manufacturing Process in Some Elamite Copper Alloy Artefacts from Haft Tappeh, South-west Iran

SEM and ToF-SIMS Ion Imaging Applied to Characterization of Fungal Biodeterioration of Paper in the Context of Cultural Heritage Collections

Investigating the Firing Protocol of Athenian Pottery Production: A Raman and Hi-Resolution TEM Study

Soft X-ray Absorption Spectroscopy and Imaging of Sulfur in Lapis Lazuli

Investigation into Achaemenid Persian Painted Plasters and Glazed Bricks from Persepolis and Pasargadae in the Smithsonian's Freer Gallery of Art

Manganese in Black Crusts on Seneca Sandstone

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract

Simplified, High-Throughput TOF-SIMS Analysis via HR2 and Uniform Molecular Imaging of Rough Surfaces

Probing Liquid Surfaces and Interfaces Using Time-of-Flight Secondary Ion Mass Spectrometry

Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Imaging and Analysis of Cultural Heritage Materials

Abstract

Surface & Subsurface Microscopy & Microanalysis in Materials & Biological Systems

Abstract