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Nanocharacterization and Electrical Properties of Grain Boundaries in Gd/Pr Doubly-Doped Ceria

Published online by Cambridge University Press:  27 August 2014

W. J. Bowman ,
J. Zhu  and
P. A. Crozier
W. J. Bowman
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106
J. Zhu
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106
P. A. Crozier
Affiliation:
School for the Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287-6106

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1894 - 1895
Copyright
Copyright © Microscopy Society of America 2014 

References

1 Guo, X., et al, Journal of The Electrochemical Society, 148 (3) E121-E126 (2001).Google Scholar
2. Avila-Paredes, H.J., et al, Solid State Ionics 177 (2006) 3075-3080.Google Scholar
3. Sharma, V., et al, Chemical Physics Letters, 495 (2010)280-2862.Google Scholar
4. We thank the National Science Foundation’s Graduate Research Fellowship Program (DGE-1311230), and NSF DMR 1308085 for funding this work. We also gratefully acknowledge support of ASU’s John M. Cowley Center for High Resolution Electron Microscopy.Google Scholar