Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges

Abstract

In Situ High Temperature Atomic Resolution Transmission Electron Microscopy of 2D Nanomaterials

Transverse Vibration of Circular Double-Layer Graphene Sheets Using Nonlocal Elasticity Theory

A New Structural Model for Graphene Oxide and Reduced Graphene Oxide as Revealed by Core EELS and DFT

Morphology and Structure Anlysis of Graphene by Low Voltage TEM

Asymmetric Decoration of Crystalline Graphene with Pt&TiO2 Nanocrystals as High-Efficient Photocatalyst

A Green Method for Graphite Exfoliation, Effect of Milling Intensity.

Al4C3/Ag Formation in an Aluminum Composite Produced by High-Energy Ball Milling.

FIB, TEM and AFM Quantitative Investigation of Nanostructure and Nanoscale Friction Properties of Single Partially Fluorinated Carbon Nanofibres

Electron Diffraction-Based Quality Evaluation of Graphene Films

π-Plasmon Dispersion in Free-Standing Monolayer Graphene Investigated by Momentum-Resolved Electron Energy-Loss Spectroscopy

A Study of Single-Walled Carbon Nanotube Cap Structure Using Field Emission Image

Ordered and Disordered Carbon Structures Detected by TEM in Carbide-derived Carbons Produced from TiC

Analytical Transmission Electron Microscopy Investigation of the Fluorination Process of Carbon Nanoparticles.

Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM

Immobilization and Encapsulation of Micro- and Nano- Objects with Electron Transparent Graphene Oxide membranes

Microanalysis of Irradiated Materials: Preparation, Instrumental Development, and Analysis

Abstract

Microbeam analysis techniques for the characterisation of irradiated nuclear fuel

Use of Secondary Ions Mass Spectrometry (SIMS) for Cladding Materials Post-Irradiation Examination (PIE)

Electron Backscatter Diffraction of Nuclear Materials

Microstructural Characterization of the Irradiated Nuclear Fuels

The Focused Ion Beam-SEM as a Critical Tool For Nano-scale Characterization of Highly Radioactive Nuclear Fuels

Microscopy and Microanalysis

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Volume 20 - August 2014

Physical Sciences Symposia

Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges

Abstract

Microanalysis of Irradiated Materials: Preparation, Instrumental Development, and Analysis

Abstract